Studies of buried interfaces Cu(In,Ga)Se2/CdS XPS and electrical investigations

Authors focus attention on the CIGS/CdS hetero-interface at different stages of its formation using mainly XPS studies of buried interfaces which were studied after gradual sputtering. Authors have investigated interfaces on CIGS submitted to various surface treatments, analogue to those involved in...

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Bibliographic Details
Published in:Thin solid films 2003-05, Vol.431-432 (1-2), p.289-295
Main Authors: Canava, B., Vigneron, J., Etcheberry, A., Guimard, D., Grand, P.P., Guillemoles, J.-F., Lincot, D., Ould Saad Hamatly, S., Djebbour, Z., Mencaraglia, D.
Format: Article
Language:English
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Physics
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Summary:Authors focus attention on the CIGS/CdS hetero-interface at different stages of its formation using mainly XPS studies of buried interfaces which were studied after gradual sputtering. Authors have investigated interfaces on CIGS submitted to various surface treatments, analogue to those involved in fabrication steps. Kelvin probe and admittance spectroscopy measurements have been also performed on several interfaces prepared in the same conditions to correlate the chemical composition with the electrical response of the buried interfaces. 13 refs.
ISSN:0040-6090
DOI:10.1016/S0040-6090(03)00273-6