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A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC
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Published in: | IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2016-11 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | |
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ISSN: | 1549-8328 1558-0806 |
DOI: | 10.1109/TCSI.2016.2602387 |