New insights into micro/nanoscale combined probes (nanoAuger, μxPS) to characterize Ag/Au@SiO2core-shell assemblies

• Published in: Nanoscale 2014-10, Vol.6 (19), p.11130-11140
• Main Authors: Ledeuil, Jean-Bernard, Uhart, A., Soulé, Samantha, Allouche, Joachim, Dupin, Jean-Charles, Martinez, Hervé
• Format: Article
• Language: English
• Subjects: Chemical Sciences; Material chemistry
• ISSN: 2040-3364; 2040-3372
• DOI: 10.1039/c4nr03211j

This work has examined the elemental distribution and local morphology at the nanoscale of core@shell Ag/Au@SiO2particles. The characterization of such complex metal/insulator materials becomes more efficient when using an initial cross-section method of preparation of the core@shell nanoparticles (ion milling cross polisher). The originality of this route of preparation allows one to obtain undamaged, well-defined and planar layers of cross-cut nano-objects. Once combined with high-resolution techniques of characterization (XPS, Auger and SEM), the process appears as a powerful way to minimize charging effects and enhance the outcoming electron signal (potentially affected by the topography of the material) during analysis. SEM experiments have unambiguously revealed the hollow-morphology of the metal core, while Auger spectroscopy observations showed chemical heterogeneity within the particles (as silver and gold are randomly found in the core ring). To our knowledge, this is the first time that Auger nano probe spectroscopy has been used and successfully optimized for the study of some complex metal/inorganic interfaces at such a high degree of resolution (≈12 nm). Complementarily, XPS Au 4f and Ag 3d peaks were finally detected attesting the possibility of access to the whole chemistry of such nanostructured assemblies.