Study of low multiplicity electron source LEETECH with diamond detector

In this paper, we present experimental and numerical studies of the calibration of low-multiplicity electron source using signals from electrons incident on a diamond detector. The experiments were performed at the newly commissioned versatile LEETECH platform at the PHIL photoinjector facility at L...

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Bibliographic Details
Published in:Journal of instrumentation 2017-02, Vol.12 (2), p.P02011-P02011
Main Authors: Kubytskyi, V., Krylov, V., Bambade, P., Cabouat, B., Wicek, F., Bogard, F., Barsuk, S., Rodin, V., Burmistrov, L., Bezshyyko, O., Attie, D., Colas, P., Fedorchuk, O., Golinka-Bezshyyko, L., Lopez, R., Monard, H., Cayla, J.-N., Sukhonos, D., Titov, M., Tomassini, D., Variola, A.
Format: Article
Language:English
Subjects:
Beams (radiation)
Calibration
Detectors
Diamonds
Electron sources
Halos
Instrumentation
Instrumentation and Detectors
Micrometers
Physics
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Summary:In this paper, we present experimental and numerical studies of the calibration of low-multiplicity electron source using signals from electrons incident on a diamond detector. The experiments were performed at the newly commissioned versatile LEETECH platform at the PHIL photoinjector facility at LAL. We show that with a single crystal CVD diamonds of 500 micrometers thickness, the energy losses from the first three electrons of 2.5-3 MeV are clearly resolved. The described technique can be used as a complementary approach for calibration of diamond detectors as well as for diagnostics of accelerated beam halos in a regime down to a few particles.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/12/02/P02011