XPS study of photo- and thermally-induced changes in amorphous Ge xAs40-xS60

The electronic structure of GexAs40- xS60 glasses and amorphous films has been obtained by means of X-ray photoelectron spectroscopy. Core level peaks and valence band spectra in the dependence on the composition as well as on structural changes initiated by illumination and/or annealing have been i...

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Bibliographic Details
Published in:Physica. B, Condensed matter Condensed matter, 2006-01, Vol.371 (2), p.302-308
Main Authors: Pamukchieva, V., Gonbeau, Danielle, Guimon, Marie-Françoise, Skordeva, E., Dedryvère, Rémi, Arsova, D.
Format: Article
Language:English
Subjects:
Chemical Sciences
Material chemistry
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Summary:The electronic structure of GexAs40- xS60 glasses and amorphous films has been obtained by means of X-ray photoelectron spectroscopy. Core level peaks and valence band spectra in the dependence on the composition as well as on structural changes initiated by illumination and/or annealing have been investigated and discussed. © 2005 Elsevier B.V. All rights reserved.
ISSN:0921-4526
1873-2135
DOI:10.1016/j.physb.2005.10.133