Time-resolved quantitative-phase microscopy of laser-material interactions using a wavefront sensor

We report on a simple and efficient technique based on a wavefront sensor to obtain time-resolved amplitude and phase images of laser-material interactions. The main interest of the technique is to obtain quantitative self-calibrated phase measurements in one shot at the femtosecond time-scale, with...

Full description

Saved in:
Bibliographic Details
Published in:Optics letters 2016-07, Vol.41 (14), p.3245-3248
Main Authors: Gallais, Laurent, Monneret, Serge
Format: Article
Language:English
Subjects:
Optics
Physics
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report on a simple and efficient technique based on a wavefront sensor to obtain time-resolved amplitude and phase images of laser-material interactions. The main interest of the technique is to obtain quantitative self-calibrated phase measurements in one shot at the femtosecond time-scale, with high spatial resolution. The technique is used for direct observation and quantitative measurement of the Kerr effect in a fused silica substrate and free electron generation by photo-ionization processes in an optical coating.
ISSN:0146-9592
1539-4794
DOI:10.1364/OL.41.003245