Limits on rough-particle sizing with low-defocus interferometric imaging

We present a rigorous theoretical model for the influence of the aperture in interferometric out-of-focus imaging. We investigate the role of this effect on the properties of speckle-like patterns generated by irregular, rough particles. Finally, we determine the conditions under which these pattern...

Full description

Saved in:
Bibliographic Details
Published in:Particuology 2015-10, Vol.22 (5), p.52-58
Main Authors: Brunel, M., Ouldarbi, L., Shen, H., Gréhan, G., Coëtmellec, S.
Format: Article
Language:English
Subjects:
Engineering Sciences
Generalized Huygens–Fresnel integrals
Interferometric out-of-focus imaging
Irregular rough particles
仪器
干涉成像
粗粒
设计
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We present a rigorous theoretical model for the influence of the aperture in interferometric out-of-focus imaging. We investigate the role of this effect on the properties of speckle-like patterns generated by irregular, rough particles. Finally, we determine the conditions under which these patterns are no longer representative of particle size but of the aperture itself and the defocus parameter.
ISSN:1674-2001
2210-4291
DOI:10.1016/j.partic.2014.07.008