Chemically deposited tin sulphide

• Published in: Journal of alloys and compounds 2010-02, Vol.490 (1), p.180-183
• Main Authors: Akkari, A., Guasch, C., Kamoun-Turki, N.
• Format: Article
• Language: English
• Subjects: Chemical bath deposition; Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Deposition; Electronics; Engineering Sciences; Exact sciences and technology; Liquid phase epitaxy; deposition from liquid phases (melts, solutions, and surface layers on liquids); Materials science; Methods of deposition of films and coatings; film growth and epitaxy; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation; Optical properties of specific thin films; Other semiconductors; Physics; SnS; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film; Thin film structure and morphology; Tin sulphide
• ISSN: 0925-8388; 1873-4669
• DOI: 10.1016/j.jallcom.2009.08.140

SnS thin films were deposited on glass substrates after multi-deposition runs by chemical bath deposition from aqueous solution containing 30 ml triethanolamine (TEA) (C 6H 15NO 3) (50%), 10 ml thioacetamide (CH 3CSNH 2), 8 ml ammonia (NH 3) solution and 10 ml of Sn 2+(0.1 M). These films were characterised with X-ray diffraction (XRD), with scanning electron microscopy, and with spectrophotometric measurements. The obtained thin films exhibit the zinc blend structure, the crystallinity seems to be improved as the film thickness increases and the band gap energy is found to be about 1.76 eV for film prepared after six depositions runs.