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Theoretical insights and experimental characterization of HfO 2 -based OxRRAMs operation

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Bibliographic Details
Published in:Journal of computational electronics 2017-12, Vol.16 (4), p.1045-1056
Main Authors: Traore, Boubacar, Blaise, Patrick, Vianello, E., Sklenard, B.
Format: Article
Language:English
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ISSN:1569-8025
1572-8137
DOI:10.1007/s10825-017-1085-5