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Resistive switching study in HfO 2 based resistive memories by conductive atomic force microscopy in vacuum
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Published in: | Journal of applied physics 2018-07, Vol.124 (1) |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | |
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ISSN: | 0021-8979 1089-7550 |
DOI: | 10.1063/1.5025143 |