Test and Reliability in Approximate Computing

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision...

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Bibliographic Details
Published in:Journal of electronic testing 2018-08, Vol.34 (4), p.375-387
Main Authors: Anghel, Lorena, Benabdenbi, Mounir, Bosio, Alberto, Traiola, Marcello, Vatajelu, Elena Ioana
Format: Article
Language:English
Subjects:
Approximation
CAE) and Design
Circuits and Systems
Computation
Computer-Aided Engineering (CAD
Electrical Engineering
Engineering
Engineering Sciences
Life expectancy
Micro and nanotechnologies
Microelectronics
Power consumption
Software reliability
Test procedures
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Summary:This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.
ISSN:0923-8174
1573-0727
DOI:10.1007/s10836-018-5734-9