Test and Reliability in Approximate Computing

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision...

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Published in:Journal of electronic testing 2018-08, Vol.34 (4), p.375-387
Main Authors: Anghel, Lorena, Benabdenbi, Mounir, Bosio, Alberto, Traiola, Marcello, Vatajelu, Elena Ioana
Format: Article
Language:English
Subjects:
Approximation
CAE) and Design
Circuits and Systems
Computation
Computer-Aided Engineering (CAD
Electrical Engineering
Engineering
Engineering Sciences
Life expectancy
Micro and nanotechnologies
Microelectronics
Power consumption
Software reliability
Test procedures
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cited_by cdi_FETCH-LOGICAL-c350t-c59cc301fdef782e8a9ce459b50d162037277501c6cb1d902e3b3679fcb21e673
cites cdi_FETCH-LOGICAL-c350t-c59cc301fdef782e8a9ce459b50d162037277501c6cb1d902e3b3679fcb21e673
container_end_page 387
container_issue 4
container_start_page 375
container_title Journal of electronic testing
container_volume 34
creator Anghel, Lorena
Benabdenbi, Mounir
Bosio, Alberto
Traiola, Marcello
Vatajelu, Elena Ioana
description This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.
doi_str_mv 10.1007/s10836-018-5734-9
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fullrecord <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_01961787v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2047952124</sourcerecordid><originalsourceid>FETCH-LOGICAL-c350t-c59cc301fdef782e8a9ce459b50d162037277501c6cb1d902e3b3679fcb21e673</originalsourceid><addsrcrecordid>eNp1kEFLxDAQhYMouK7-AG8FTx6iM0nTJMdlUVdYEGQ9hzRN1y7dtjatuP_eLBU9eZph-N7jzSPkGuEOAeR9QFA8o4CKCslTqk_IDONGQTJ5SmagGacKZXpOLkLYQdQwkc0I3fgwJLYpkldfVzav6mo4JFWTLLqub7-qvR18smz33ThUzfaSnJW2Dv7qZ87J2-PDZrmi65en5-ViTR0XMFAntHMcsCx8KRXzymrnU6FzAQVmDHjMJAWgy1yOhQbmec4zqUuXM_SZ5HNyO_m-29p0fUzRH0xrK7NarM3xBqgzlEp-YmRvJjbm_RjjN2bXjn0T4xkGqdSCIUsjhRPl-jaE3pe_tgjm2KCZGozOyhwbNDpq2KQJkW22vv9z_l_0DdYzcMk</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2047952124</pqid></control><display><type>article</type><title>Test and Reliability in Approximate Computing</title><source>Springer Link</source><creator>Anghel, Lorena ; Benabdenbi, Mounir ; Bosio, Alberto ; Traiola, Marcello ; Vatajelu, Elena Ioana</creator><creatorcontrib>Anghel, Lorena ; Benabdenbi, Mounir ; Bosio, Alberto ; Traiola, Marcello ; Vatajelu, Elena Ioana</creatorcontrib><description>This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.</description><identifier>ISSN: 0923-8174</identifier><identifier>EISSN: 1573-0727</identifier><identifier>DOI: 10.1007/s10836-018-5734-9</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Approximation ; CAE) and Design ; Circuits and Systems ; Computation ; Computer-Aided Engineering (CAD ; Electrical Engineering ; Engineering ; Engineering Sciences ; Life expectancy ; Micro and nanotechnologies ; Microelectronics ; Power consumption ; Software reliability ; Test procedures</subject><ispartof>Journal of electronic testing, 2018-08, Vol.34 (4), p.375-387</ispartof><rights>Springer Science+Business Media, LLC, part of Springer Nature 2018</rights><rights>Journal of Electronic Testing is a copyright of Springer, (2018). All Rights Reserved.</rights><rights>Attribution - NonCommercial</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c350t-c59cc301fdef782e8a9ce459b50d162037277501c6cb1d902e3b3679fcb21e673</citedby><cites>FETCH-LOGICAL-c350t-c59cc301fdef782e8a9ce459b50d162037277501c6cb1d902e3b3679fcb21e673</cites><orcidid>0000-0002-4588-1812 ; 0000-0001-6116-7339 ; 0000-0003-1484-5162 ; 0000-0001-9569-0072</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://hal.science/hal-01961787$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Anghel, Lorena</creatorcontrib><creatorcontrib>Benabdenbi, Mounir</creatorcontrib><creatorcontrib>Bosio, Alberto</creatorcontrib><creatorcontrib>Traiola, Marcello</creatorcontrib><creatorcontrib>Vatajelu, Elena Ioana</creatorcontrib><title>Test and Reliability in Approximate Computing</title><title>Journal of electronic testing</title><addtitle>J Electron Test</addtitle><description>This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.</description><subject>Approximation</subject><subject>CAE) and Design</subject><subject>Circuits and Systems</subject><subject>Computation</subject><subject>Computer-Aided Engineering (CAD</subject><subject>Electrical Engineering</subject><subject>Engineering</subject><subject>Engineering Sciences</subject><subject>Life expectancy</subject><subject>Micro and nanotechnologies</subject><subject>Microelectronics</subject><subject>Power consumption</subject><subject>Software reliability</subject><subject>Test procedures</subject><issn>0923-8174</issn><issn>1573-0727</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kEFLxDAQhYMouK7-AG8FTx6iM0nTJMdlUVdYEGQ9hzRN1y7dtjatuP_eLBU9eZph-N7jzSPkGuEOAeR9QFA8o4CKCslTqk_IDONGQTJ5SmagGacKZXpOLkLYQdQwkc0I3fgwJLYpkldfVzav6mo4JFWTLLqub7-qvR18smz33ThUzfaSnJW2Dv7qZ87J2-PDZrmi65en5-ViTR0XMFAntHMcsCx8KRXzymrnU6FzAQVmDHjMJAWgy1yOhQbmec4zqUuXM_SZ5HNyO_m-29p0fUzRH0xrK7NarM3xBqgzlEp-YmRvJjbm_RjjN2bXjn0T4xkGqdSCIUsjhRPl-jaE3pe_tgjm2KCZGozOyhwbNDpq2KQJkW22vv9z_l_0DdYzcMk</recordid><startdate>20180801</startdate><enddate>20180801</enddate><creator>Anghel, Lorena</creator><creator>Benabdenbi, Mounir</creator><creator>Bosio, Alberto</creator><creator>Traiola, Marcello</creator><creator>Vatajelu, Elena Ioana</creator><general>Springer US</general><general>Springer Nature B.V</general><general>Springer Verlag</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QF</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7XB</scope><scope>88I</scope><scope>88K</scope><scope>8AO</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>GNUQQ</scope><scope>H8D</scope><scope>H8G</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L6V</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M2P</scope><scope>M2T</scope><scope>M7S</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0W</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-4588-1812</orcidid><orcidid>https://orcid.org/0000-0001-6116-7339</orcidid><orcidid>https://orcid.org/0000-0003-1484-5162</orcidid><orcidid>https://orcid.org/0000-0001-9569-0072</orcidid></search><sort><creationdate>20180801</creationdate><title>Test and Reliability in Approximate Computing</title><author>Anghel, Lorena ; Benabdenbi, Mounir ; Bosio, Alberto ; Traiola, Marcello ; Vatajelu, Elena Ioana</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-c59cc301fdef782e8a9ce459b50d162037277501c6cb1d902e3b3679fcb21e673</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Approximation</topic><topic>CAE) and Design</topic><topic>Circuits and Systems</topic><topic>Computation</topic><topic>Computer-Aided Engineering (CAD</topic><topic>Electrical Engineering</topic><topic>Engineering</topic><topic>Engineering Sciences</topic><topic>Life expectancy</topic><topic>Micro and nanotechnologies</topic><topic>Microelectronics</topic><topic>Power consumption</topic><topic>Software reliability</topic><topic>Test procedures</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Anghel, Lorena</creatorcontrib><creatorcontrib>Benabdenbi, Mounir</creatorcontrib><creatorcontrib>Bosio, Alberto</creatorcontrib><creatorcontrib>Traiola, Marcello</creatorcontrib><creatorcontrib>Vatajelu, Elena Ioana</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Aluminium Industry Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Materials Business File</collection><collection>Mechanical &amp; Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>Telecommunications (Alumni Edition)</collection><collection>ProQuest Pharma Collection</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology &amp; Engineering</collection><collection>Engineering Research Database</collection><collection>ProQuest Central Student</collection><collection>Aerospace Database</collection><collection>Copper Technical Reference Library</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>ProQuest Engineering Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts – Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>ProQuest Science Journals</collection><collection>Telecommunications Database</collection><collection>Engineering Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>DELNET Engineering &amp; Technology Collection</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Journal of electronic testing</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Anghel, Lorena</au><au>Benabdenbi, Mounir</au><au>Bosio, Alberto</au><au>Traiola, Marcello</au><au>Vatajelu, Elena Ioana</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Test and Reliability in Approximate Computing</atitle><jtitle>Journal of electronic testing</jtitle><stitle>J Electron Test</stitle><date>2018-08-01</date><risdate>2018</risdate><volume>34</volume><issue>4</issue><spage>375</spage><epage>387</epage><pages>375-387</pages><issn>0923-8174</issn><eissn>1573-0727</eissn><abstract>This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10836-018-5734-9</doi><tpages>13</tpages><orcidid>https://orcid.org/0000-0002-4588-1812</orcidid><orcidid>https://orcid.org/0000-0001-6116-7339</orcidid><orcidid>https://orcid.org/0000-0003-1484-5162</orcidid><orcidid>https://orcid.org/0000-0001-9569-0072</orcidid></addata></record>
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ispartof Journal of electronic testing, 2018-08, Vol.34 (4), p.375-387
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1573-0727
language eng
recordid cdi_hal_primary_oai_HAL_hal_01961787v1
source Springer Link
subjects Approximation
CAE) and Design
Circuits and Systems
Computation
Computer-Aided Engineering (CAD
Electrical Engineering
Engineering
Engineering Sciences
Life expectancy
Micro and nanotechnologies
Microelectronics
Power consumption
Software reliability
Test procedures
title Test and Reliability in Approximate Computing
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T07%3A20%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Test%20and%20Reliability%20in%20Approximate%20Computing&rft.jtitle=Journal%20of%20electronic%20testing&rft.au=Anghel,%20Lorena&rft.date=2018-08-01&rft.volume=34&rft.issue=4&rft.spage=375&rft.epage=387&rft.pages=375-387&rft.issn=0923-8174&rft.eissn=1573-0727&rft_id=info:doi/10.1007/s10836-018-5734-9&rft_dat=%3Cproquest_hal_p%3E2047952124%3C/proquest_hal_p%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c350t-c59cc301fdef782e8a9ce459b50d162037277501c6cb1d902e3b3679fcb21e673%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2047952124&rft_id=info:pmid/&rfr_iscdi=true