Loading…
Evidence of Sub-Band Modulated Transport in Planar Fully Depleted Silicon-on-Insulator MOSFETs
Modulation of the sub-band electron population in the inversion channel of 10-nm planar fully depleted silicon-on-insulator MOSFETs is evidenced by the bias dependence of inversion layer transport parameters. Two distinct inversion-layer electron species were detected by magnetic-field-dependent mag...
Saved in:
Published in: | IEEE electron device letters 2014-11, Vol.35 (11), p.1082-1084 |
---|---|
Main Authors: | , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c367t-a7982bad8ccd5379ea1492a2f9b15b530dce109b6c81762931006a264d9aa76d3 |
---|---|
cites | cdi_FETCH-LOGICAL-c367t-a7982bad8ccd5379ea1492a2f9b15b530dce109b6c81762931006a264d9aa76d3 |
container_end_page | 1084 |
container_issue | 11 |
container_start_page | 1082 |
container_title | IEEE electron device letters |
container_volume | 35 |
creator | Umana-Membreno, Gilberto A. Sung-Jae Chang Bawedin, Maryline Antoszewski, Jarek Cristoloveanu, Sorin Faraone, Lorenzo |
description | Modulation of the sub-band electron population in the inversion channel of 10-nm planar fully depleted silicon-on-insulator MOSFETs is evidenced by the bias dependence of inversion layer transport parameters. Two distinct inversion-layer electron species were detected by magnetic-field-dependent magnetoresistance measurements and high-resolution mobility spectrum analysis. According to self-consistent Poisson-Schrödinger calculations, these species correspond to carriers in distinct sub-bands within the Si channel region. The mobility peak of the carrier with the highest sheet density occurs under gate bias conditions that result in a minimum perpendicular effective electric field. |
doi_str_mv | 10.1109/LED.2014.2358201 |
format | article |
fullrecord | <record><control><sourceid>hal_ieee_</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_02003507v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6910219</ieee_id><sourcerecordid>oai_HAL_hal_02003507v1</sourcerecordid><originalsourceid>FETCH-LOGICAL-c367t-a7982bad8ccd5379ea1492a2f9b15b530dce109b6c81762931006a264d9aa76d3</originalsourceid><addsrcrecordid>eNo9kEtLAzEUhYMoWKt7wU22LqbmMUkmy9qHLUyp0Lo1ZJIMjsSZkrSF_nsztBQu3MvhOxfOAeAZoxHGSL6Vs-mIIJyPCGVFOm7AADNWZIhxegsGSOQ4oxjxe_AQ4y9KZC7yAfieHRvrWuNgV8PNocredWvhqrMHr_fOwm3Qbdx1YQ-bFn563eoA5wfvT3Dqdt71yKbxjenaLM2yjb2vC3C13sxn2_gI7mrto3u67CH4SvJkkZXrj-VkXGaGcrHPtJAFqbQtjLGMCuk0ziXRpJYVZhWjyBqXQlbcFFhwIlMQxDXhuZVaC27pELye__5or3ah-dPhpDrdqMW4VL2GCEKUIXHEiUVn1oQuxuDqqwEj1XepUpeq71JdukyWl7Olcc5dcS4xIljSf2oObk8</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Evidence of Sub-Band Modulated Transport in Planar Fully Depleted Silicon-on-Insulator MOSFETs</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Umana-Membreno, Gilberto A. ; Sung-Jae Chang ; Bawedin, Maryline ; Antoszewski, Jarek ; Cristoloveanu, Sorin ; Faraone, Lorenzo</creator><creatorcontrib>Umana-Membreno, Gilberto A. ; Sung-Jae Chang ; Bawedin, Maryline ; Antoszewski, Jarek ; Cristoloveanu, Sorin ; Faraone, Lorenzo</creatorcontrib><description>Modulation of the sub-band electron population in the inversion channel of 10-nm planar fully depleted silicon-on-insulator MOSFETs is evidenced by the bias dependence of inversion layer transport parameters. Two distinct inversion-layer electron species were detected by magnetic-field-dependent magnetoresistance measurements and high-resolution mobility spectrum analysis. According to self-consistent Poisson-Schrödinger calculations, these species correspond to carriers in distinct sub-bands within the Si channel region. The mobility peak of the carrier with the highest sheet density occurs under gate bias conditions that result in a minimum perpendicular effective electric field.</description><identifier>ISSN: 0741-3106</identifier><identifier>EISSN: 1558-0563</identifier><identifier>DOI: 10.1109/LED.2014.2358201</identifier><identifier>CODEN: EDLEDZ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Engineering Sciences ; FD-SOI ; Hall-effect ; Logic gates ; magnetoresistance ; Micro and nanotechnologies ; Microelectronics ; mobility ; mobility spectrum analysis ; MOSFET ; Silicon ; Silicon-on-insulator ; Sociology ; Spectral analysis ; Statistics ; volume inversion</subject><ispartof>IEEE electron device letters, 2014-11, Vol.35 (11), p.1082-1084</ispartof><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c367t-a7982bad8ccd5379ea1492a2f9b15b530dce109b6c81762931006a264d9aa76d3</citedby><cites>FETCH-LOGICAL-c367t-a7982bad8ccd5379ea1492a2f9b15b530dce109b6c81762931006a264d9aa76d3</cites><orcidid>0000-0002-3576-5586 ; 0000-0001-9984-7591</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6910219$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,314,778,782,883,27911,27912,54783</link.rule.ids><backlink>$$Uhttps://hal.science/hal-02003507$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Umana-Membreno, Gilberto A.</creatorcontrib><creatorcontrib>Sung-Jae Chang</creatorcontrib><creatorcontrib>Bawedin, Maryline</creatorcontrib><creatorcontrib>Antoszewski, Jarek</creatorcontrib><creatorcontrib>Cristoloveanu, Sorin</creatorcontrib><creatorcontrib>Faraone, Lorenzo</creatorcontrib><title>Evidence of Sub-Band Modulated Transport in Planar Fully Depleted Silicon-on-Insulator MOSFETs</title><title>IEEE electron device letters</title><addtitle>LED</addtitle><description>Modulation of the sub-band electron population in the inversion channel of 10-nm planar fully depleted silicon-on-insulator MOSFETs is evidenced by the bias dependence of inversion layer transport parameters. Two distinct inversion-layer electron species were detected by magnetic-field-dependent magnetoresistance measurements and high-resolution mobility spectrum analysis. According to self-consistent Poisson-Schrödinger calculations, these species correspond to carriers in distinct sub-bands within the Si channel region. The mobility peak of the carrier with the highest sheet density occurs under gate bias conditions that result in a minimum perpendicular effective electric field.</description><subject>Engineering Sciences</subject><subject>FD-SOI</subject><subject>Hall-effect</subject><subject>Logic gates</subject><subject>magnetoresistance</subject><subject>Micro and nanotechnologies</subject><subject>Microelectronics</subject><subject>mobility</subject><subject>mobility spectrum analysis</subject><subject>MOSFET</subject><subject>Silicon</subject><subject>Silicon-on-insulator</subject><subject>Sociology</subject><subject>Spectral analysis</subject><subject>Statistics</subject><subject>volume inversion</subject><issn>0741-3106</issn><issn>1558-0563</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNo9kEtLAzEUhYMoWKt7wU22LqbmMUkmy9qHLUyp0Lo1ZJIMjsSZkrSF_nsztBQu3MvhOxfOAeAZoxHGSL6Vs-mIIJyPCGVFOm7AADNWZIhxegsGSOQ4oxjxe_AQ4y9KZC7yAfieHRvrWuNgV8PNocredWvhqrMHr_fOwm3Qbdx1YQ-bFn563eoA5wfvT3Dqdt71yKbxjenaLM2yjb2vC3C13sxn2_gI7mrto3u67CH4SvJkkZXrj-VkXGaGcrHPtJAFqbQtjLGMCuk0ziXRpJYVZhWjyBqXQlbcFFhwIlMQxDXhuZVaC27pELye__5or3ah-dPhpDrdqMW4VL2GCEKUIXHEiUVn1oQuxuDqqwEj1XepUpeq71JdukyWl7Olcc5dcS4xIljSf2oObk8</recordid><startdate>20141101</startdate><enddate>20141101</enddate><creator>Umana-Membreno, Gilberto A.</creator><creator>Sung-Jae Chang</creator><creator>Bawedin, Maryline</creator><creator>Antoszewski, Jarek</creator><creator>Cristoloveanu, Sorin</creator><creator>Faraone, Lorenzo</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-3576-5586</orcidid><orcidid>https://orcid.org/0000-0001-9984-7591</orcidid></search><sort><creationdate>20141101</creationdate><title>Evidence of Sub-Band Modulated Transport in Planar Fully Depleted Silicon-on-Insulator MOSFETs</title><author>Umana-Membreno, Gilberto A. ; Sung-Jae Chang ; Bawedin, Maryline ; Antoszewski, Jarek ; Cristoloveanu, Sorin ; Faraone, Lorenzo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c367t-a7982bad8ccd5379ea1492a2f9b15b530dce109b6c81762931006a264d9aa76d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Engineering Sciences</topic><topic>FD-SOI</topic><topic>Hall-effect</topic><topic>Logic gates</topic><topic>magnetoresistance</topic><topic>Micro and nanotechnologies</topic><topic>Microelectronics</topic><topic>mobility</topic><topic>mobility spectrum analysis</topic><topic>MOSFET</topic><topic>Silicon</topic><topic>Silicon-on-insulator</topic><topic>Sociology</topic><topic>Spectral analysis</topic><topic>Statistics</topic><topic>volume inversion</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Umana-Membreno, Gilberto A.</creatorcontrib><creatorcontrib>Sung-Jae Chang</creatorcontrib><creatorcontrib>Bawedin, Maryline</creatorcontrib><creatorcontrib>Antoszewski, Jarek</creatorcontrib><creatorcontrib>Cristoloveanu, Sorin</creatorcontrib><creatorcontrib>Faraone, Lorenzo</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>IEEE electron device letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Umana-Membreno, Gilberto A.</au><au>Sung-Jae Chang</au><au>Bawedin, Maryline</au><au>Antoszewski, Jarek</au><au>Cristoloveanu, Sorin</au><au>Faraone, Lorenzo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Evidence of Sub-Band Modulated Transport in Planar Fully Depleted Silicon-on-Insulator MOSFETs</atitle><jtitle>IEEE electron device letters</jtitle><stitle>LED</stitle><date>2014-11-01</date><risdate>2014</risdate><volume>35</volume><issue>11</issue><spage>1082</spage><epage>1084</epage><pages>1082-1084</pages><issn>0741-3106</issn><eissn>1558-0563</eissn><coden>EDLEDZ</coden><abstract>Modulation of the sub-band electron population in the inversion channel of 10-nm planar fully depleted silicon-on-insulator MOSFETs is evidenced by the bias dependence of inversion layer transport parameters. Two distinct inversion-layer electron species were detected by magnetic-field-dependent magnetoresistance measurements and high-resolution mobility spectrum analysis. According to self-consistent Poisson-Schrödinger calculations, these species correspond to carriers in distinct sub-bands within the Si channel region. The mobility peak of the carrier with the highest sheet density occurs under gate bias conditions that result in a minimum perpendicular effective electric field.</abstract><pub>IEEE</pub><doi>10.1109/LED.2014.2358201</doi><tpages>3</tpages><orcidid>https://orcid.org/0000-0002-3576-5586</orcidid><orcidid>https://orcid.org/0000-0001-9984-7591</orcidid></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0741-3106 |
ispartof | IEEE electron device letters, 2014-11, Vol.35 (11), p.1082-1084 |
issn | 0741-3106 1558-0563 |
language | eng |
recordid | cdi_hal_primary_oai_HAL_hal_02003507v1 |
source | IEEE Electronic Library (IEL) Journals |
subjects | Engineering Sciences FD-SOI Hall-effect Logic gates magnetoresistance Micro and nanotechnologies Microelectronics mobility mobility spectrum analysis MOSFET Silicon Silicon-on-insulator Sociology Spectral analysis Statistics volume inversion |
title | Evidence of Sub-Band Modulated Transport in Planar Fully Depleted Silicon-on-Insulator MOSFETs |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T09%3A26%3A32IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-hal_ieee_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Evidence%20of%20Sub-Band%20Modulated%20Transport%20in%20Planar%20Fully%20Depleted%20Silicon-on-Insulator%20MOSFETs&rft.jtitle=IEEE%20electron%20device%20letters&rft.au=Umana-Membreno,%20Gilberto%20A.&rft.date=2014-11-01&rft.volume=35&rft.issue=11&rft.spage=1082&rft.epage=1084&rft.pages=1082-1084&rft.issn=0741-3106&rft.eissn=1558-0563&rft.coden=EDLEDZ&rft_id=info:doi/10.1109/LED.2014.2358201&rft_dat=%3Chal_ieee_%3Eoai_HAL_hal_02003507v1%3C/hal_ieee_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c367t-a7982bad8ccd5379ea1492a2f9b15b530dce109b6c81762931006a264d9aa76d3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6910219&rfr_iscdi=true |