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Computer-aided interferometric measurements of drift and phase shifter calibration for digital speckle pattern interferometry

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Bibliographic Details
Published in:Optical Engineering 1995-12, Vol.34 (12), p.3526-3530
Main Authors: Slangen, Pierre R, De Veuster, Christophe, Renotte, Yvon L. M, Berwart, Leon, Lion, Yves F
Format: Article
Language:English
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ISSN:0091-3286
1560-2303
DOI:10.1117/12.215666