Computer-aided interferometric measurements of drift and phase shifter calibration for digital speckle pattern interferometry

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Published in:Optical Engineering 1995-12, Vol.34 (12), p.3526-3530
Main Authors: Slangen, Pierre R, De Veuster, Christophe, Renotte, Yvon L. M, Berwart, Leon, Lion, Yves F
Format: Article
Language:English
Subjects:
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Interferometers
Optical instruments, equipment and techniques
Optics
Phase shifting interferometry
Physics
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container_end_page 3530
container_issue 12
container_start_page 3526
container_title Optical Engineering
container_volume 34
creator Slangen, Pierre R
De Veuster, Christophe
Renotte, Yvon L. M
Berwart, Leon
Lion, Yves F
description
doi_str_mv 10.1117/12.215666
format article
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ispartof Optical Engineering, 1995-12, Vol.34 (12), p.3526-3530
issn 0091-3286
1560-2303
language eng
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source SPIE Digital Library (Journals)
subjects Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Interferometers
Optical instruments, equipment and techniques
Optics
Phase shifting interferometry
Physics
title Computer-aided interferometric measurements of drift and phase shifter calibration for digital speckle pattern interferometry
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