Loading…
HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy
The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin (
Saved in:
| Published in: | Ultramicroscopy 2015-12, Vol.159, p.403-412 |
|---|---|
| Main Authors: | , , , , , , |
| Format: | Article |
| Language: | English |
| Subjects: | |
| Citations: | Items that this one cites Items that cite this one |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| cited_by | cdi_FETCH-LOGICAL-c505t-6d9158822d6524b468f91039d60577d92b3bf3369509edcdc2270215b959de4b3 |
|---|---|
| cites | cdi_FETCH-LOGICAL-c505t-6d9158822d6524b468f91039d60577d92b3bf3369509edcdc2270215b959de4b3 |
| container_end_page | 412 |
| container_issue | |
| container_start_page | 403 |
| container_title | Ultramicroscopy |
| container_volume | 159 |
| creator | Lefebvre, W. Hernandez-Maldonado, D. Moyon, F. Cuvilly, F. Vaudolon, C. Shinde, D. Vurpillot, F. |
| description | The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin ( |
| doi_str_mv | 10.1016/j.ultramic.2015.02.011 |
| format | article |
| fullrecord | <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_02107619v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0304399115000261</els_id><sourcerecordid>1751196062</sourcerecordid><originalsourceid>FETCH-LOGICAL-c505t-6d9158822d6524b468f91039d60577d92b3bf3369509edcdc2270215b959de4b3</originalsourceid><addsrcrecordid>eNqNkcFu1DAQhi0EotvCK1Q5wiFhbMd2zIlVaVmkRRxYzpZje1uvknhrJ4v2xjvwhn0SvErbK5w8Gn3_zD_-EbrEUGHA_MOumrox6t6bigBmFZAKMH6BFrgRsiSC0JdoARTqkkqJz9B5SjsAwFA3r9EZYaIWpKELtFstl59vHn7_-bG5_lboMfSFCdMw-uG28MPc2MfQuiJX4Tbq_d2xSHtnfO-G9LHYhF862lTcTzqLRj36g8sTYnTdXGeHMSQT9sc36NVWd8m9fXwv0M-b683Vqlx___L1arkuDQM2ltxKzJqGEMsZqduaN1uJgUrLgQlhJWlpu6WUSwbSWWMNIQIIZq1k0rq6pRfo_Tz3TndqH32v41EF7dVquVanXqZBcCwPOLPvZjbfeD-5NKreJ-O6Tg8uTElhISlpRA3iP1CGseTASUb5jJ5OT9Ftn21gUKf41E49xadO8WVLKseXhZePO6a2d_ZZ9pRXBj7NgMsfePAuqmS8G4yzPjozKhv8v3b8Be9_rwg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1751196062</pqid></control><display><type>article</type><title>HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy</title><source>ScienceDirect Freedom Collection 2022-2024</source><creator>Lefebvre, W. ; Hernandez-Maldonado, D. ; Moyon, F. ; Cuvilly, F. ; Vaudolon, C. ; Shinde, D. ; Vurpillot, F.</creator><creatorcontrib>Lefebvre, W. ; Hernandez-Maldonado, D. ; Moyon, F. ; Cuvilly, F. ; Vaudolon, C. ; Shinde, D. ; Vurpillot, F.</creatorcontrib><description>The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin (<20nm), tips display a curved surface and a significantly larger thickness. As far as a correlative approach aims at analysing the same specimen by both techniques, it is mandatory to explore the limits and advantages imposed by the particular geometry of atom probe tomography specimens. Based on simulations (electron probe propagation and image simulations), the possibility to apply quantitative high angle annular dark field scanning transmission electron microscopy to of atom probe tomography specimens has been tested. The influence of electron probe convergence and the benefice of deconvolution of electron probe point spread function electron have been established. Atom counting in atom probe tomography specimens is for the first time reported in this present work. It is demonstrated that, based on single projections of high angle annular dark field imaging, significant quantitative information can be used as additional input for refining the data obtained by correlative analysis of the specimen in APT, therefore opening new perspectives in the field of atomic scale tomography.
•Quantitative correlative microscopy by APT and STEM is considered.•The particular geometry of atom probe tomography (APT) specimens is considered.•HAADF–STEM image simulations were applied.•The possibility of atom counting is demonstrated for protuberant particles.</description><identifier>ISSN: 0304-3991</identifier><identifier>EISSN: 1879-2723</identifier><identifier>DOI: 10.1016/j.ultramic.2015.02.011</identifier><identifier>PMID: 25747283</identifier><language>eng</language><publisher>Netherlands: Elsevier B.V</publisher><subject>Annular ; Atom counting ; Atom probe tomography ; Atomic force microscopy ; Correlation analysis ; Correlative microscopy ; Counting ; Electron probes ; HAADF ; Physics ; Simulation ; STEM ; Tips ; Tomography</subject><ispartof>Ultramicroscopy, 2015-12, Vol.159, p.403-412</ispartof><rights>2015 Elsevier B.V.</rights><rights>Copyright © 2015 Elsevier B.V. All rights reserved.</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c505t-6d9158822d6524b468f91039d60577d92b3bf3369509edcdc2270215b959de4b3</citedby><cites>FETCH-LOGICAL-c505t-6d9158822d6524b468f91039d60577d92b3bf3369509edcdc2270215b959de4b3</cites><orcidid>0000-0002-6834-3507 ; 0000-0002-0640-8555</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,780,784,885,27924,27925</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/25747283$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-02107619$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Lefebvre, W.</creatorcontrib><creatorcontrib>Hernandez-Maldonado, D.</creatorcontrib><creatorcontrib>Moyon, F.</creatorcontrib><creatorcontrib>Cuvilly, F.</creatorcontrib><creatorcontrib>Vaudolon, C.</creatorcontrib><creatorcontrib>Shinde, D.</creatorcontrib><creatorcontrib>Vurpillot, F.</creatorcontrib><title>HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy</title><title>Ultramicroscopy</title><addtitle>Ultramicroscopy</addtitle><description>The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin (<20nm), tips display a curved surface and a significantly larger thickness. As far as a correlative approach aims at analysing the same specimen by both techniques, it is mandatory to explore the limits and advantages imposed by the particular geometry of atom probe tomography specimens. Based on simulations (electron probe propagation and image simulations), the possibility to apply quantitative high angle annular dark field scanning transmission electron microscopy to of atom probe tomography specimens has been tested. The influence of electron probe convergence and the benefice of deconvolution of electron probe point spread function electron have been established. Atom counting in atom probe tomography specimens is for the first time reported in this present work. It is demonstrated that, based on single projections of high angle annular dark field imaging, significant quantitative information can be used as additional input for refining the data obtained by correlative analysis of the specimen in APT, therefore opening new perspectives in the field of atomic scale tomography.
•Quantitative correlative microscopy by APT and STEM is considered.•The particular geometry of atom probe tomography (APT) specimens is considered.•HAADF–STEM image simulations were applied.•The possibility of atom counting is demonstrated for protuberant particles.</description><subject>Annular</subject><subject>Atom counting</subject><subject>Atom probe tomography</subject><subject>Atomic force microscopy</subject><subject>Correlation analysis</subject><subject>Correlative microscopy</subject><subject>Counting</subject><subject>Electron probes</subject><subject>HAADF</subject><subject>Physics</subject><subject>Simulation</subject><subject>STEM</subject><subject>Tips</subject><subject>Tomography</subject><issn>0304-3991</issn><issn>1879-2723</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNqNkcFu1DAQhi0EotvCK1Q5wiFhbMd2zIlVaVmkRRxYzpZje1uvknhrJ4v2xjvwhn0SvErbK5w8Gn3_zD_-EbrEUGHA_MOumrox6t6bigBmFZAKMH6BFrgRsiSC0JdoARTqkkqJz9B5SjsAwFA3r9EZYaIWpKELtFstl59vHn7_-bG5_lboMfSFCdMw-uG28MPc2MfQuiJX4Tbq_d2xSHtnfO-G9LHYhF862lTcTzqLRj36g8sTYnTdXGeHMSQT9sc36NVWd8m9fXwv0M-b683Vqlx___L1arkuDQM2ltxKzJqGEMsZqduaN1uJgUrLgQlhJWlpu6WUSwbSWWMNIQIIZq1k0rq6pRfo_Tz3TndqH32v41EF7dVquVanXqZBcCwPOLPvZjbfeD-5NKreJ-O6Tg8uTElhISlpRA3iP1CGseTASUb5jJ5OT9Ftn21gUKf41E49xadO8WVLKseXhZePO6a2d_ZZ9pRXBj7NgMsfePAuqmS8G4yzPjozKhv8v3b8Be9_rwg</recordid><startdate>20151201</startdate><enddate>20151201</enddate><creator>Lefebvre, W.</creator><creator>Hernandez-Maldonado, D.</creator><creator>Moyon, F.</creator><creator>Cuvilly, F.</creator><creator>Vaudolon, C.</creator><creator>Shinde, D.</creator><creator>Vurpillot, F.</creator><general>Elsevier B.V</general><general>Elsevier</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>1XC</scope><orcidid>https://orcid.org/0000-0002-6834-3507</orcidid><orcidid>https://orcid.org/0000-0002-0640-8555</orcidid></search><sort><creationdate>20151201</creationdate><title>HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy</title><author>Lefebvre, W. ; Hernandez-Maldonado, D. ; Moyon, F. ; Cuvilly, F. ; Vaudolon, C. ; Shinde, D. ; Vurpillot, F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c505t-6d9158822d6524b468f91039d60577d92b3bf3369509edcdc2270215b959de4b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Annular</topic><topic>Atom counting</topic><topic>Atom probe tomography</topic><topic>Atomic force microscopy</topic><topic>Correlation analysis</topic><topic>Correlative microscopy</topic><topic>Counting</topic><topic>Electron probes</topic><topic>HAADF</topic><topic>Physics</topic><topic>Simulation</topic><topic>STEM</topic><topic>Tips</topic><topic>Tomography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lefebvre, W.</creatorcontrib><creatorcontrib>Hernandez-Maldonado, D.</creatorcontrib><creatorcontrib>Moyon, F.</creatorcontrib><creatorcontrib>Cuvilly, F.</creatorcontrib><creatorcontrib>Vaudolon, C.</creatorcontrib><creatorcontrib>Shinde, D.</creatorcontrib><creatorcontrib>Vurpillot, F.</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Ultramicroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lefebvre, W.</au><au>Hernandez-Maldonado, D.</au><au>Moyon, F.</au><au>Cuvilly, F.</au><au>Vaudolon, C.</au><au>Shinde, D.</au><au>Vurpillot, F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy</atitle><jtitle>Ultramicroscopy</jtitle><addtitle>Ultramicroscopy</addtitle><date>2015-12-01</date><risdate>2015</risdate><volume>159</volume><spage>403</spage><epage>412</epage><pages>403-412</pages><issn>0304-3991</issn><eissn>1879-2723</eissn><abstract>The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin (<20nm), tips display a curved surface and a significantly larger thickness. As far as a correlative approach aims at analysing the same specimen by both techniques, it is mandatory to explore the limits and advantages imposed by the particular geometry of atom probe tomography specimens. Based on simulations (electron probe propagation and image simulations), the possibility to apply quantitative high angle annular dark field scanning transmission electron microscopy to of atom probe tomography specimens has been tested. The influence of electron probe convergence and the benefice of deconvolution of electron probe point spread function electron have been established. Atom counting in atom probe tomography specimens is for the first time reported in this present work. It is demonstrated that, based on single projections of high angle annular dark field imaging, significant quantitative information can be used as additional input for refining the data obtained by correlative analysis of the specimen in APT, therefore opening new perspectives in the field of atomic scale tomography.
•Quantitative correlative microscopy by APT and STEM is considered.•The particular geometry of atom probe tomography (APT) specimens is considered.•HAADF–STEM image simulations were applied.•The possibility of atom counting is demonstrated for protuberant particles.</abstract><cop>Netherlands</cop><pub>Elsevier B.V</pub><pmid>25747283</pmid><doi>10.1016/j.ultramic.2015.02.011</doi><tpages>10</tpages><orcidid>https://orcid.org/0000-0002-6834-3507</orcidid><orcidid>https://orcid.org/0000-0002-0640-8555</orcidid></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0304-3991 |
| ispartof | Ultramicroscopy, 2015-12, Vol.159, p.403-412 |
| issn | 0304-3991 1879-2723 |
| language | eng |
| recordid | cdi_hal_primary_oai_HAL_hal_02107619v1 |
| source | ScienceDirect Freedom Collection 2022-2024 |
| subjects | Annular Atom counting Atom probe tomography Atomic force microscopy Correlation analysis Correlative microscopy Counting Electron probes HAADF Physics Simulation STEM Tips Tomography |
| title | HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy |
| url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-02T07%3A24%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=HAADF%E2%80%93STEM%20atom%20counting%20in%20atom%20probe%20tomography%20specimens:%20Towards%20quantitative%20correlative%20microscopy&rft.jtitle=Ultramicroscopy&rft.au=Lefebvre,%20W.&rft.date=2015-12-01&rft.volume=159&rft.spage=403&rft.epage=412&rft.pages=403-412&rft.issn=0304-3991&rft.eissn=1879-2723&rft_id=info:doi/10.1016/j.ultramic.2015.02.011&rft_dat=%3Cproquest_hal_p%3E1751196062%3C/proquest_hal_p%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c505t-6d9158822d6524b468f91039d60577d92b3bf3369509edcdc2270215b959de4b3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=1751196062&rft_id=info:pmid/25747283&rfr_iscdi=true |