Coupling atom probe tomography and photoluminescence spectroscopy: Exploratory results and perspectives

• Published in: Ultramicroscopy 2013-09, Vol.132, p.75-80
• Main Authors: Rigutti, Lorenzo, Vella, Angela, Vurpillot, François, Gaillard, Aurore, Sevelin-Radiguet, Nicolas, Houard, Jonathan, Hideur, Ammar, Martel, Gilles, Jacopin, Gwénolé, Luna Bugallo, Andrés De, Deconihout, Bernard
• Format: Article
• Language: English
• Subjects: Atom probe tomography; Engineering Sciences; Instrumental developement; Instrumentation and Detectors; Optics; Photoluminescence; Photonic; Physics; Semiconductors
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/j.ultramic.2013.02.002

The development of laser-assisted atom probes makes it possible, in principle, to exploit the femtosecond laser pulse not only for triggering ion evaporation from a nanometric field emission tip, but also for generating photons via the radiative recombination of electron-hole pairs in tips made of dielectric materials. In this article we demonstrate a first step towards a correlation of micro-photoluminescence (μ-PL) and laser-assisted tomographic atom probe (LA-TAP) analysis applied separately on the same objects, namely on ZnO microwires. In particular, we assess that the use of the focused ion beam (FIB) tip preparation method significantly degrades the radiative recombination yield of the analyzed microwires. We discuss the strategies to avoid the FIB-induced damage on the optical properties of the sample and how to get beyond the correlated μ-PL and LA-TAP analysis with a coupled approach allowing to perform the two analyses within the same instrument. ► The laser pulse of tomographic atom probes can be exploited for μ-PL spectroscopy. ► Discussion on the information retrievable by this coupled APT-μ-PL approach. ► Discussion on how to implement this coupled approach. ► Study of focused ion beam-induced damage on the optical properties of ZnO microwires. ► First correlated analysis of μ-PL and atom probe tomography of ZnO microwires.