Local refractive index probed via the fluorescence decay of semiconductor quantum dots

We present a novel approach for convenient tuning of the local refractive index around nanostructures. We apply this technique to study the influence of the local refractive index on the radiative decay time of CdSe/ZnS quantum dots with three distinct emission wavelengths. The dependence of the lum...

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Bibliographic Details
Published in:Optics express 2012-01, Vol.20 (3), p.3200-3208
Main Authors: Pillonnet, Anne, Fleury, Pierre, Chizhik, Alexey I, Chizhik, Anna M, Amans, David, Ledoux, Gilles, Kulzer, Florian, Meixner, Alfred J, Dujardin, Christophe
Format: Article
Language:English
Subjects:
Algorithms
Condensed Matter
Luminescent Measurements - methods
Materials Testing - methods
Physics
Quantum Dots
Refractometry - methods
Semiconductors
Spectrometry, Fluorescence - methods
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Summary:We present a novel approach for convenient tuning of the local refractive index around nanostructures. We apply this technique to study the influence of the local refractive index on the radiative decay time of CdSe/ZnS quantum dots with three distinct emission wavelengths. The dependence of the luminescence decay time on the environment is well described by an effective medium approach. A critical distance of about 80 nm is found for the determination of the effective local index of refraction. An estimation for the emitting-state quantum efficiency can be extracted.
ISSN:1094-4087
1094-4087
DOI:10.1364/oe.20.003200