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Effect of Ferromagnetic Material on the Reduction of Parasitic Emission in Near Field

In this article the results of measurement in near-field concerning a 16-bit microcontroller from Freescale are reported, with and without a film of ferromagnetic material (Permalloy) plated against the surface of its package. This material improves near-field electromagnetic compatibility performan...

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Bibliographic Details
Published in:Ferroelectrics 2008-01, Vol.371 (1), p.133-138
Main Authors: Bouhouch, L., Boyer, A., Bendhia, S., Sicard, E., Fadel, M.
Format: Article
Language:English
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Summary:In this article the results of measurement in near-field concerning a 16-bit microcontroller from Freescale are reported, with and without a film of ferromagnetic material (Permalloy) plated against the surface of its package. This material improves near-field electromagnetic compatibility performances by reducing, in good proportion, the parasitic emission.
ISSN:0015-0193
1563-5112
DOI:10.1080/00150190802397791