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On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves

Fitting the I / V curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and...

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Published in:Physical chemistry chemical physics : PCCP 2020-01, Vol.22 (46), p.26702-26706
Main Authors: Delmas, Vincent, Diez-Cabanes, Valentin, van Dyck, Colin, Scheer, Elke, Costuas, Karine, Cornil, Jérôme
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cited_by cdi_FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3
cites cdi_FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3
container_end_page 26706
container_issue 46
container_start_page 26702
container_title Physical chemistry chemical physics : PCCP
container_volume 22
creator Delmas, Vincent
Diez-Cabanes, Valentin
van Dyck, Colin
Scheer, Elke
Costuas, Karine
Cornil, Jérôme
description Fitting the I / V curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and hence provide unreliable molecular parameters. This is illustrated here by extracting key molecular parameters by fitting computed voltage-dependent transmission spectra and by comparing them to the values obtained by fitting the calculated I / V curves with a typical Lorentzian model used in the literature. Doing so, we observe a large discrepancy between the two sets of values which warns us about the risks of using simple fitting expressions. Interestingly, we demonstrate that the quality of the fit can be improved by imposing the low bias conductance and Seebeck coefficient of the junction to be recovered in the fitting procedure.
doi_str_mv 10.1039/d0cp05372d
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fullrecord <record><control><sourceid>proquest_hal_p</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_03037926v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2463110595</sourcerecordid><originalsourceid>FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3</originalsourceid><addsrcrecordid>eNpdkUFPAjEQhRujEUQv_oImXtQEmW633e2RgArJJnhQr5tutyslyxbaLgn-ehcxHDzN5OWbl5l5CN0SeCJAxagEtQFGk6g8Q30SczoUkMbnpz7hPXTl_QoACCP0EvUojQgnkPSRWjQ4LDV2ujayMLUJe2wrLNW2Nc40X3hta63aWjq8ahsVjG3wRjq51kE7j4s9zqzTTfg2ssGVCeEw0xnM8Qh_YtW6nfbX6KKStdc3f3WAPl6e3yezYbZ4nU_G2VDFnIVhXMaCFKXkJAERp4InJWdQSgaC8bSIeMorVXGZREp3WsQKKqXgnKRUlSXVdIAejr5LWecbZ9bS7XMrTT4bZ_lBAwo0ERHfkY69P7IbZ7et9iFfG690XctG29bnUfc6QoAJ1qF3_9CVbV3TXXKgUpoSgLSjHo-UctZ7p6vTBgTyQ0z5FCZvvzFN6Q98J4Er</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2468381008</pqid></control><display><type>article</type><title>On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves</title><source>Royal Society of Chemistry</source><creator>Delmas, Vincent ; Diez-Cabanes, Valentin ; van Dyck, Colin ; Scheer, Elke ; Costuas, Karine ; Cornil, Jérôme</creator><creatorcontrib>Delmas, Vincent ; Diez-Cabanes, Valentin ; van Dyck, Colin ; Scheer, Elke ; Costuas, Karine ; Cornil, Jérôme</creatorcontrib><description>Fitting the I / V curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and hence provide unreliable molecular parameters. This is illustrated here by extracting key molecular parameters by fitting computed voltage-dependent transmission spectra and by comparing them to the values obtained by fitting the calculated I / V curves with a typical Lorentzian model used in the literature. Doing so, we observe a large discrepancy between the two sets of values which warns us about the risks of using simple fitting expressions. Interestingly, we demonstrate that the quality of the fit can be improved by imposing the low bias conductance and Seebeck coefficient of the junction to be recovered in the fitting procedure.</description><identifier>ISSN: 1463-9076</identifier><identifier>EISSN: 1463-9084</identifier><identifier>DOI: 10.1039/d0cp05372d</identifier><identifier>PMID: 33216107</identifier><language>eng</language><publisher>Cambridge: Royal Society of Chemistry</publisher><subject>Chemical Sciences ; Coupling (molecular) ; Curve fitting ; Energy levels ; Mathematical models ; Parameters ; Resistance ; Seebeck effect</subject><ispartof>Physical chemistry chemical physics : PCCP, 2020-01, Vol.22 (46), p.26702-26706</ispartof><rights>Copyright Royal Society of Chemistry 2020</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3</citedby><cites>FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3</cites><orcidid>0000-0003-0338-0494 ; 0000-0003-2527-1627 ; 0000-0003-3788-6979 ; 0000-0003-2853-3821 ; 0000-0002-6234-2749 ; 0000-0002-5479-4227</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,777,781,882,27905,27906</link.rule.ids><backlink>$$Uhttps://hal.science/hal-03037926$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Delmas, Vincent</creatorcontrib><creatorcontrib>Diez-Cabanes, Valentin</creatorcontrib><creatorcontrib>van Dyck, Colin</creatorcontrib><creatorcontrib>Scheer, Elke</creatorcontrib><creatorcontrib>Costuas, Karine</creatorcontrib><creatorcontrib>Cornil, Jérôme</creatorcontrib><title>On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves</title><title>Physical chemistry chemical physics : PCCP</title><description>Fitting the I / V curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and hence provide unreliable molecular parameters. This is illustrated here by extracting key molecular parameters by fitting computed voltage-dependent transmission spectra and by comparing them to the values obtained by fitting the calculated I / V curves with a typical Lorentzian model used in the literature. Doing so, we observe a large discrepancy between the two sets of values which warns us about the risks of using simple fitting expressions. Interestingly, we demonstrate that the quality of the fit can be improved by imposing the low bias conductance and Seebeck coefficient of the junction to be recovered in the fitting procedure.</description><subject>Chemical Sciences</subject><subject>Coupling (molecular)</subject><subject>Curve fitting</subject><subject>Energy levels</subject><subject>Mathematical models</subject><subject>Parameters</subject><subject>Resistance</subject><subject>Seebeck effect</subject><issn>1463-9076</issn><issn>1463-9084</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNpdkUFPAjEQhRujEUQv_oImXtQEmW633e2RgArJJnhQr5tutyslyxbaLgn-ehcxHDzN5OWbl5l5CN0SeCJAxagEtQFGk6g8Q30SczoUkMbnpz7hPXTl_QoACCP0EvUojQgnkPSRWjQ4LDV2ujayMLUJe2wrLNW2Nc40X3hta63aWjq8ahsVjG3wRjq51kE7j4s9zqzTTfg2ssGVCeEw0xnM8Qh_YtW6nfbX6KKStdc3f3WAPl6e3yezYbZ4nU_G2VDFnIVhXMaCFKXkJAERp4InJWdQSgaC8bSIeMorVXGZREp3WsQKKqXgnKRUlSXVdIAejr5LWecbZ9bS7XMrTT4bZ_lBAwo0ERHfkY69P7IbZ7et9iFfG690XctG29bnUfc6QoAJ1qF3_9CVbV3TXXKgUpoSgLSjHo-UctZ7p6vTBgTyQ0z5FCZvvzFN6Q98J4Er</recordid><startdate>20200101</startdate><enddate>20200101</enddate><creator>Delmas, Vincent</creator><creator>Diez-Cabanes, Valentin</creator><creator>van Dyck, Colin</creator><creator>Scheer, Elke</creator><creator>Costuas, Karine</creator><creator>Cornil, Jérôme</creator><general>Royal Society of Chemistry</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>7X8</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0003-0338-0494</orcidid><orcidid>https://orcid.org/0000-0003-2527-1627</orcidid><orcidid>https://orcid.org/0000-0003-3788-6979</orcidid><orcidid>https://orcid.org/0000-0003-2853-3821</orcidid><orcidid>https://orcid.org/0000-0002-6234-2749</orcidid><orcidid>https://orcid.org/0000-0002-5479-4227</orcidid></search><sort><creationdate>20200101</creationdate><title>On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves</title><author>Delmas, Vincent ; Diez-Cabanes, Valentin ; van Dyck, Colin ; Scheer, Elke ; Costuas, Karine ; Cornil, Jérôme</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Chemical Sciences</topic><topic>Coupling (molecular)</topic><topic>Curve fitting</topic><topic>Energy levels</topic><topic>Mathematical models</topic><topic>Parameters</topic><topic>Resistance</topic><topic>Seebeck effect</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Delmas, Vincent</creatorcontrib><creatorcontrib>Diez-Cabanes, Valentin</creatorcontrib><creatorcontrib>van Dyck, Colin</creatorcontrib><creatorcontrib>Scheer, Elke</creatorcontrib><creatorcontrib>Costuas, Karine</creatorcontrib><creatorcontrib>Cornil, Jérôme</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Physical chemistry chemical physics : PCCP</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Delmas, Vincent</au><au>Diez-Cabanes, Valentin</au><au>van Dyck, Colin</au><au>Scheer, Elke</au><au>Costuas, Karine</au><au>Cornil, Jérôme</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves</atitle><jtitle>Physical chemistry chemical physics : PCCP</jtitle><date>2020-01-01</date><risdate>2020</risdate><volume>22</volume><issue>46</issue><spage>26702</spage><epage>26706</epage><pages>26702-26706</pages><issn>1463-9076</issn><eissn>1463-9084</eissn><abstract>Fitting the I / V curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and hence provide unreliable molecular parameters. This is illustrated here by extracting key molecular parameters by fitting computed voltage-dependent transmission spectra and by comparing them to the values obtained by fitting the calculated I / V curves with a typical Lorentzian model used in the literature. Doing so, we observe a large discrepancy between the two sets of values which warns us about the risks of using simple fitting expressions. Interestingly, we demonstrate that the quality of the fit can be improved by imposing the low bias conductance and Seebeck coefficient of the junction to be recovered in the fitting procedure.</abstract><cop>Cambridge</cop><pub>Royal Society of Chemistry</pub><pmid>33216107</pmid><doi>10.1039/d0cp05372d</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0003-0338-0494</orcidid><orcidid>https://orcid.org/0000-0003-2527-1627</orcidid><orcidid>https://orcid.org/0000-0003-3788-6979</orcidid><orcidid>https://orcid.org/0000-0003-2853-3821</orcidid><orcidid>https://orcid.org/0000-0002-6234-2749</orcidid><orcidid>https://orcid.org/0000-0002-5479-4227</orcidid><oa>free_for_read</oa></addata></record>
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1463-9084
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recordid cdi_hal_primary_oai_HAL_hal_03037926v1
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subjects Chemical Sciences
Coupling (molecular)
Curve fitting
Energy levels
Mathematical models
Parameters
Resistance
Seebeck effect
title On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T06%3A04%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_hal_p&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=On%20the%20reliability%20of%20acquiring%20molecular%20junction%20parameters%20by%20Lorentzian%20fitting%20of%20I%20/%20V%20curves&rft.jtitle=Physical%20chemistry%20chemical%20physics%20:%20PCCP&rft.au=Delmas,%20Vincent&rft.date=2020-01-01&rft.volume=22&rft.issue=46&rft.spage=26702&rft.epage=26706&rft.pages=26702-26706&rft.issn=1463-9076&rft.eissn=1463-9084&rft_id=info:doi/10.1039/d0cp05372d&rft_dat=%3Cproquest_hal_p%3E2463110595%3C/proquest_hal_p%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2468381008&rft_id=info:pmid/33216107&rfr_iscdi=true