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On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves
Fitting the I / V curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and...
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Published in: | Physical chemistry chemical physics : PCCP 2020-01, Vol.22 (46), p.26702-26706 |
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container_end_page | 26706 |
container_issue | 46 |
container_start_page | 26702 |
container_title | Physical chemistry chemical physics : PCCP |
container_volume | 22 |
creator | Delmas, Vincent Diez-Cabanes, Valentin van Dyck, Colin Scheer, Elke Costuas, Karine Cornil, Jérôme |
description | Fitting the
I
/
V
curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and hence provide unreliable molecular parameters. This is illustrated here by extracting key molecular parameters by fitting computed voltage-dependent transmission spectra and by comparing them to the values obtained by fitting the calculated
I
/
V
curves with a typical Lorentzian model used in the literature. Doing so, we observe a large discrepancy between the two sets of values which warns us about the risks of using simple fitting expressions. Interestingly, we demonstrate that the quality of the fit can be improved by imposing the low bias conductance and Seebeck coefficient of the junction to be recovered in the fitting procedure. |
doi_str_mv | 10.1039/d0cp05372d |
format | article |
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I
/
V
curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and hence provide unreliable molecular parameters. This is illustrated here by extracting key molecular parameters by fitting computed voltage-dependent transmission spectra and by comparing them to the values obtained by fitting the calculated
I
/
V
curves with a typical Lorentzian model used in the literature. Doing so, we observe a large discrepancy between the two sets of values which warns us about the risks of using simple fitting expressions. Interestingly, we demonstrate that the quality of the fit can be improved by imposing the low bias conductance and Seebeck coefficient of the junction to be recovered in the fitting procedure.</description><identifier>ISSN: 1463-9076</identifier><identifier>EISSN: 1463-9084</identifier><identifier>DOI: 10.1039/d0cp05372d</identifier><identifier>PMID: 33216107</identifier><language>eng</language><publisher>Cambridge: Royal Society of Chemistry</publisher><subject>Chemical Sciences ; Coupling (molecular) ; Curve fitting ; Energy levels ; Mathematical models ; Parameters ; Resistance ; Seebeck effect</subject><ispartof>Physical chemistry chemical physics : PCCP, 2020-01, Vol.22 (46), p.26702-26706</ispartof><rights>Copyright Royal Society of Chemistry 2020</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3</citedby><cites>FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3</cites><orcidid>0000-0003-0338-0494 ; 0000-0003-2527-1627 ; 0000-0003-3788-6979 ; 0000-0003-2853-3821 ; 0000-0002-6234-2749 ; 0000-0002-5479-4227</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>230,314,777,781,882,27905,27906</link.rule.ids><backlink>$$Uhttps://hal.science/hal-03037926$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Delmas, Vincent</creatorcontrib><creatorcontrib>Diez-Cabanes, Valentin</creatorcontrib><creatorcontrib>van Dyck, Colin</creatorcontrib><creatorcontrib>Scheer, Elke</creatorcontrib><creatorcontrib>Costuas, Karine</creatorcontrib><creatorcontrib>Cornil, Jérôme</creatorcontrib><title>On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves</title><title>Physical chemistry chemical physics : PCCP</title><description>Fitting the
I
/
V
curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and hence provide unreliable molecular parameters. This is illustrated here by extracting key molecular parameters by fitting computed voltage-dependent transmission spectra and by comparing them to the values obtained by fitting the calculated
I
/
V
curves with a typical Lorentzian model used in the literature. Doing so, we observe a large discrepancy between the two sets of values which warns us about the risks of using simple fitting expressions. Interestingly, we demonstrate that the quality of the fit can be improved by imposing the low bias conductance and Seebeck coefficient of the junction to be recovered in the fitting procedure.</description><subject>Chemical Sciences</subject><subject>Coupling (molecular)</subject><subject>Curve fitting</subject><subject>Energy levels</subject><subject>Mathematical models</subject><subject>Parameters</subject><subject>Resistance</subject><subject>Seebeck effect</subject><issn>1463-9076</issn><issn>1463-9084</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNpdkUFPAjEQhRujEUQv_oImXtQEmW633e2RgArJJnhQr5tutyslyxbaLgn-ehcxHDzN5OWbl5l5CN0SeCJAxagEtQFGk6g8Q30SczoUkMbnpz7hPXTl_QoACCP0EvUojQgnkPSRWjQ4LDV2ujayMLUJe2wrLNW2Nc40X3hta63aWjq8ahsVjG3wRjq51kE7j4s9zqzTTfg2ssGVCeEw0xnM8Qh_YtW6nfbX6KKStdc3f3WAPl6e3yezYbZ4nU_G2VDFnIVhXMaCFKXkJAERp4InJWdQSgaC8bSIeMorVXGZREp3WsQKKqXgnKRUlSXVdIAejr5LWecbZ9bS7XMrTT4bZ_lBAwo0ERHfkY69P7IbZ7et9iFfG690XctG29bnUfc6QoAJ1qF3_9CVbV3TXXKgUpoSgLSjHo-UctZ7p6vTBgTyQ0z5FCZvvzFN6Q98J4Er</recordid><startdate>20200101</startdate><enddate>20200101</enddate><creator>Delmas, Vincent</creator><creator>Diez-Cabanes, Valentin</creator><creator>van Dyck, Colin</creator><creator>Scheer, Elke</creator><creator>Costuas, Karine</creator><creator>Cornil, Jérôme</creator><general>Royal Society of Chemistry</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><scope>7X8</scope><scope>1XC</scope><scope>VOOES</scope><orcidid>https://orcid.org/0000-0003-0338-0494</orcidid><orcidid>https://orcid.org/0000-0003-2527-1627</orcidid><orcidid>https://orcid.org/0000-0003-3788-6979</orcidid><orcidid>https://orcid.org/0000-0003-2853-3821</orcidid><orcidid>https://orcid.org/0000-0002-6234-2749</orcidid><orcidid>https://orcid.org/0000-0002-5479-4227</orcidid></search><sort><creationdate>20200101</creationdate><title>On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves</title><author>Delmas, Vincent ; Diez-Cabanes, Valentin ; van Dyck, Colin ; Scheer, Elke ; Costuas, Karine ; Cornil, Jérôme</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c465t-4d491bda6170948967d650da509568b2686fcf6a72ce50925b3aa966183cdd3e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Chemical Sciences</topic><topic>Coupling (molecular)</topic><topic>Curve fitting</topic><topic>Energy levels</topic><topic>Mathematical models</topic><topic>Parameters</topic><topic>Resistance</topic><topic>Seebeck effect</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Delmas, Vincent</creatorcontrib><creatorcontrib>Diez-Cabanes, Valentin</creatorcontrib><creatorcontrib>van Dyck, Colin</creatorcontrib><creatorcontrib>Scheer, Elke</creatorcontrib><creatorcontrib>Costuas, Karine</creatorcontrib><creatorcontrib>Cornil, Jérôme</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>MEDLINE - Academic</collection><collection>Hyper Article en Ligne (HAL)</collection><collection>Hyper Article en Ligne (HAL) (Open Access)</collection><jtitle>Physical chemistry chemical physics : PCCP</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Delmas, Vincent</au><au>Diez-Cabanes, Valentin</au><au>van Dyck, Colin</au><au>Scheer, Elke</au><au>Costuas, Karine</au><au>Cornil, Jérôme</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves</atitle><jtitle>Physical chemistry chemical physics : PCCP</jtitle><date>2020-01-01</date><risdate>2020</risdate><volume>22</volume><issue>46</issue><spage>26702</spage><epage>26706</epage><pages>26702-26706</pages><issn>1463-9076</issn><eissn>1463-9084</eissn><abstract>Fitting the
I
/
V
curves of molecular junctions by simple analytical models is often done to extract relevant molecular parameters such as energy level alignment or interfacial electronic coupling to build up useful property-relationships. However, such models can suffer from severe limitations and hence provide unreliable molecular parameters. This is illustrated here by extracting key molecular parameters by fitting computed voltage-dependent transmission spectra and by comparing them to the values obtained by fitting the calculated
I
/
V
curves with a typical Lorentzian model used in the literature. Doing so, we observe a large discrepancy between the two sets of values which warns us about the risks of using simple fitting expressions. Interestingly, we demonstrate that the quality of the fit can be improved by imposing the low bias conductance and Seebeck coefficient of the junction to be recovered in the fitting procedure.</abstract><cop>Cambridge</cop><pub>Royal Society of Chemistry</pub><pmid>33216107</pmid><doi>10.1039/d0cp05372d</doi><tpages>5</tpages><orcidid>https://orcid.org/0000-0003-0338-0494</orcidid><orcidid>https://orcid.org/0000-0003-2527-1627</orcidid><orcidid>https://orcid.org/0000-0003-3788-6979</orcidid><orcidid>https://orcid.org/0000-0003-2853-3821</orcidid><orcidid>https://orcid.org/0000-0002-6234-2749</orcidid><orcidid>https://orcid.org/0000-0002-5479-4227</orcidid><oa>free_for_read</oa></addata></record> |
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source | Royal Society of Chemistry |
subjects | Chemical Sciences Coupling (molecular) Curve fitting Energy levels Mathematical models Parameters Resistance Seebeck effect |
title | On the reliability of acquiring molecular junction parameters by Lorentzian fitting of I / V curves |
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