Grain growth and damages induced by transient heat loads on W

During H-mode plasma in ITER, type-I Edge Localized Modes can occur naturally leading to transient heat load (

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Bibliographic Details
Published in:Physica scripta 2021-12, Vol.96 (12), p.124032
Main Authors: Minissale, M, Durif, A, Kermouche, G, Richou, M, Gallais, L
Format: Article
Language:English
Subjects:
cracks
ELMs
Engineering Sciences
grain growth
Materials
Nuclear Experiment
Physics
recrystallization
transient heat loads
tungsten
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Description
Summary:During H-mode plasma in ITER, type-I Edge Localized Modes can occur naturally leading to transient heat load (
ISSN:0031-8949
1402-4896
DOI:10.1088/1402-4896/ac27df