Hot-carrier damage from high to low voltage using the energy-driven framework

In this work, we confirm that the energy is the driving force of Hot Carrier effects. When the energy is high, the Energy-driven framework allows to retrieve Lucky Electron Model-like equations. But when the energy is lowered, high energy electrons generated by Electron-Electron Scattering become th...

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Published in:Microelectronic engineering 2007-09, Vol.84 (9), p.1938-1942
Main Authors: Guerin, C., Huard, V., Bravaix, A.
Format: Article
Language:English
Subjects:
Age function
Applied sciences
Electron-electron scattering
Electronics
Energy-driven
Engineering Sciences
Exact sciences and technology
Hot-carrier
MOS transistor
Multiple vibrationnal excitation
Reliability
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Transistors
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cited_by cdi_FETCH-LOGICAL-c392t-3a63cfc78d9bebb7d6ab2dd381455116ce9beafe5b0f9626f19014d2e2229e123
cites cdi_FETCH-LOGICAL-c392t-3a63cfc78d9bebb7d6ab2dd381455116ce9beafe5b0f9626f19014d2e2229e123
container_end_page 1942
container_issue 9
container_start_page 1938
container_title Microelectronic engineering
container_volume 84
creator Guerin, C.
Huard, V.
Bravaix, A.
description In this work, we confirm that the energy is the driving force of Hot Carrier effects. When the energy is high, the Energy-driven framework allows to retrieve Lucky Electron Model-like equations. But when the energy is lowered, high energy electrons generated by Electron-Electron Scattering become the dominant contribution to the degradation. For even lower energy Multiple Vibrational Excitation mechanism starts taking the lead.
doi_str_mv 10.1016/j.mee.2007.04.104
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subjects Age function
Applied sciences
Electron-electron scattering
Electronics
Energy-driven
Engineering Sciences
Exact sciences and technology
Hot-carrier
MOS transistor
Multiple vibrationnal excitation
Reliability
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Transistors
title Hot-carrier damage from high to low voltage using the energy-driven framework
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