Properties of Ultra-Thin NbN Films for Membrane-Type THz HEB

Various buffer layers have been investigated in order to improve the crystalline quality of NbN ultra-thin films. The structural properties, the thickness, the surface morphology of 5 10 nm NbN films have been studied by different techniques. Uncertainty on thickness measurements in this range and t...

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Bibliographic Details
Published in:Journal of low temperature physics 2008, Vol.151, p.570-574
Main Authors: Guillet, B., Arthursson, Ö., Méchin, L., Metzner, M. N., Chauvat, M. P., Ruterana, P., Drakinskiy, V., Cherednichenko, Sergey, Lefèvre, Roland, Delorme, Yan, Krieg, Jean-Michel
Format: Article
Language:English
Subjects:
Astrophysics
Physics
Online Access:Get full text
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Summary:Various buffer layers have been investigated in order to improve the crystalline quality of NbN ultra-thin films. The structural properties, the thickness, the surface morphology of 5 10 nm NbN films have been studied by different techniques. Uncertainty on thickness measurements in this range and the relation between NbN film quality and gain bandwidth are discussed in the framework of their use in Hot Electron Bolometers (HEB).
ISSN:0022-2291
1573-7357
DOI:10.1007/s10909-007-9694-1