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EBSD, XRD and SRS characterization of a casting Al-7wt%Si alloy processed by equal channel angular extrusion: Dislocation density evaluation
Aluminum‑silicon (AlSi) alloys of high silicon contents are composite materials; they are used whenever high casting properties are required. They are slightly ductile below 8wt%Si. An increase in ductility can be obtained by refining Si-crystals in elaboration or by a further hot working. In the pr...
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Published in: | Materials characterization 2019-07, Vol.153, p.190-198 |
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Main Authors: | , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Aluminum‑silicon (AlSi) alloys of high silicon contents are composite materials; they are used whenever high casting properties are required. They are slightly ductile below 8wt%Si. An increase in ductility can be obtained by refining Si-crystals in elaboration or by a further hot working. In the present work, an Al-7wt%Si alloy was processed by Equal Channel Angular Extrusion (ECAE) at temperatures 20 °C and 160 °C up to three passes. The die was formed by two cylindrical channels with characteristic angles Φ = 110° and Ψ = 0. EBSD, X ray diffraction (XRD) and Strain Rate Sensitivity (SRS) were used to characterize the microstructure and the mechanical properties. High levels of strain were introduced at both temperatures. The activation volume was lowered to 125b3 and 210b3 at 20 °C and 160 °C respectively and was considered to be dislocation density dependent. The remaining dislocation densities calculated from EBSD, XRD and SRS experiments are quite different. This was explained by the scale difference and by the sensitivities of the methods to the free surface effect.
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•Casting Al-7wt%Si alloy was processed by ECAE at 20 °C and 160 °C.•The microstructure was highlighted by XRD and EBSD imaging.•SRS curves lead to an activation volume dislocation density dependent.•Dislocation density ρ was computed by SRS, XRD and KAM imaging.•The sensitivity of EBSD on surface effects leads to lower values of ρ. |
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ISSN: | 1044-5803 1873-4189 |
DOI: | 10.1016/j.matchar.2019.04.044 |