The Use of High Energy X-Ray Generators for TID Testing of Electronic Devices

A high energy X-ray generator is studied in order to perform dose tests on electronic components. The main idea is to reduce the photoelectric effect in order to get closer to the Compton scattering. For this, the spectrum of the X-ray generator is filtered in order to cut out the low energy photons...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2023-01, Vol.70 (8), p.1-1
Main Authors: Girones, Vincent, Boch, Jerome, Carapelle, Alain, Chapon, Arnaud, Maraine, Tadec, Labau, Timothee, Saigne, Frederic, Alia, Ruben Garcia
Format: Article
Language:English
Subjects:
BJT
Cobalt
Cobalt 60
Dose testing
Elastic scattering
Electrical & electronics engineering
Electrical and Electronic Engineering
Electronic components
Electronic equipment
Energy
Engineering, computing & technology
Generators
Ingénierie électrique & électronique
Ingénierie, informatique & technologie
Irradiation
Lead
MOS
Nuclear and High Energy Physics
Nuclear Energy and Engineering
Photoelectric effect
Photoelectricity
Photonics
Photons
Physical, chemical, mathematical & earth Sciences
Physics
Physique
Physique, chimie, mathématiques & sciences de la terre
Radiation effects
Ray generators
Scattering
Testing
Total Ionizing Dose
X-ray
X-rays
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Description
Summary:A high energy X-ray generator is studied in order to perform dose tests on electronic components. The main idea is to reduce the photoelectric effect in order to get closer to the Compton scattering. For this, the spectrum of the X-ray generator is filtered in order to cut out the low energy photons. Experimental results and simulations show that it is possible to filter the spectrum. From this result, the filtered X-ray generator is used to study the dose response of the electronic components and the obtained data are compared to the Cobalt 60 irradiation. The obtained results are analyzed and discussed. This work provides a first demonstration of the use of a filtered high-energy X-Ray generator for TID testing.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2023.3279626