Inhomogeneous spatial distribution of non radiative recombination centers in GaN/InGaN nanowire heterostructures studied by cathodoluminescence

In order to elucidate the mechanisms responsible for cathodoluminescence intensity variations at the scale of single InGaN/GaN nanowire heterostructures, a methodology is proposed based on a statistical analysis on ensembles of several hundreds of nanowires exhibiting a diameter of 180, 240 and 280...

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Bibliographic Details
Published in:Nanotechnology 2023-12, Vol.34 (49), p.495702
Main Authors: Concordel, Alexandre, Rochat, Névine, Quach, Anh My Naht, Rouvière, Jean-Luc, Jacopin, Gwénolé, Napierala, Jérôme, Daudin, Bruno
Format: Article
Language:English
Subjects:
cathodoluminescence
Engineering Sciences
InGaN nanowires
molecular beam epitaxy
Physics
point defects
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Summary:In order to elucidate the mechanisms responsible for cathodoluminescence intensity variations at the scale of single InGaN/GaN nanowire heterostructures, a methodology is proposed based on a statistical analysis on ensembles of several hundreds of nanowires exhibiting a diameter of 180, 240 and 280 nm. For 180 nm diameter, we find that intensitiy variations are consistent with incorporation of point defects obeying Poisson’s statistics. For wider diameters, intensity variations at the scale of single NWs are observed and assigned to local growth conditions fluctuations. Finally, for the less luminescent nanowires, a departure from Poisson’s statistics is observed suggesting the possible clustering of non independent point defects.
ISSN:0957-4484
1361-6528
DOI:10.1088/1361-6528/acf473