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Anodic corrosion of indium tin oxide films induced by the electrochemical oxidation of chlorides

Conducting tin-doped indium oxide (ITO) films were prepared by spray pyrolysis for study of their electrochemical stability as anodes in chloride solutions. From reflection high energy electron diffraction and transmission electron microscopy observations, ITO films present a regular polycrystalline...

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Bibliographic Details
Published in:Thin solid films 1997-06, Vol.301 (1), p.242-248
Main Authors: Folcher, G., Cachet, H., Froment, M., Bruneaux, J.
Format: Article
Language:English
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Summary:Conducting tin-doped indium oxide (ITO) films were prepared by spray pyrolysis for study of their electrochemical stability as anodes in chloride solutions. From reflection high energy electron diffraction and transmission electron microscopy observations, ITO films present a regular polycrystalline structure with a very low density of twins. Corrosion was investigated by in situ mass measurements with a quartz crystal microbalance (QCM) and by direct imaging of corrosion morphology with scanning (SEM) and transmission (TEM) electron microscopy. Corrosion was found to occur at potentials positive of chloride oxidation (0.9 V vs. saturated calomel electrode (SCE)) as long as oxygen is not evolved ( V
ISSN:0040-6090
1879-2731
DOI:10.1016/S0040-6090(97)00024-2