On the use of soft X-ray STXM for organic-inorganic halide perovskite photovoltaic materials

• Published in: Journal of electron spectroscopy and related phenomena 2023-07, Vol.266, p.147358, Article 147358
• Main Authors: Jun, Haeyeon, Dindault, Chloé, Tondelier, Denis, Geffroy, Bernard, Florea, Ileana, Bouree, Jean-Eric, Schulz, Philip, Bonnassieux, Yvan, Swaraj, Sufal
• Format: Article
• Language: English
• Subjects: Elemental composition analysis; Near-edge X-ray absorption fine structure spectroscopy; Organic-inorganic metal halide perovskite; Physics; Scanning transmission X-ray microscopy; Soft X-ray spectroscopy
• ISSN: 0368-2048; 1873-2526
• DOI: 10.1016/j.elspec.2023.147358

Metal-halide perovskites are complex materials with outstanding optoelectronic properties. Thus it is of interest to analyze these materials by using every available research tool. Synchrotron tools have played an important role in fundamental and applied research for decades. Many synchrotron-based hard X-ray tools are already providing effective feedback to the perovskite solar cell (PSC) research community. With several fourth-generation light sources up and running or under development, this contribution will continue to impact every aspect of scientific advancement including PSC research. Arguably, the contribution of soft X-rays in PSC research is relatively limited. In view of the developments in the synchrotron world and the fact that a multimethod approach, combining laboratory-based techniques as well as synchrotron-based techniques, is necessary to provide constructive feedback to the PSC community we present here a collection of arguments and procedures with the aim of highlighting the use of soft X-ray scanning transmission X-ray microscopy (STXM). Some aspects of these arguments are elaborated with STXM investigation of perovskite material formamidinium-methylammonium lead iodide (FA1−xMAxPbI3). •Soft X-ray absorption edges of hybrid perovskite materials makes soft x-ray STXM valuable tool for studying these materials.•Spatially resolved bulk as well as interface sensitive chemical and morphological mapping can be obtained using this techique.•Various considerations related to sample preparation, sample transportation and data acquisition have been presented.•Several XAS features in the C, N, O K-edge and I M-edge have been identified for some model perovskite materials.