3D Imaging and Quantitative Subsurface Dielectric Constant Measurement Using Peak Force Kelvin Probe Force Microscopy (Adv. Mater. Interfaces 2/2024)

Dielectric Constant Measurement In article 2300503, Khaled Kaja and co‐workers present a new approach to simultaneously measure the dielectric constants of buried structures and interfaces by combining peak force tapping quantitative Nano‐mechanical mapping (PF QNM) and frequency‐modulated Kelvin pr...

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Bibliographic Details
Published in:Advanced materials interfaces 2024-01, Vol.11 (2), p.n/a
Main Authors: Kaja, Khaled, Assoum, Ammar, De Wolf, Peter, Piquemal, François, Nehmee, Antonio, Naja, Adnan, Beyrouthy, Taha, Jouiad, Mustapha
Format: Article
Language:English
Subjects:
AFM
Condensed Matter
data clustering
dielectric constant
KPFM
nano tomography
peak force tapping
Physics
subsurface
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Summary:Dielectric Constant Measurement In article 2300503, Khaled Kaja and co‐workers present a new approach to simultaneously measure the dielectric constants of buried structures and interfaces by combining peak force tapping quantitative Nano‐mechanical mapping (PF QNM) and frequency‐modulated Kelvin probe force microscopy (FM‐KPFM). The developed method paves the way for 3D‐imaging of dielectric constants of composite materials and heterostructures.
ISSN:2196-7350
2196-7350
DOI:10.1002/admi.202470008