Special issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023

This special issue of Microelectronics and Reliability is devoted to the publication of the papers presented during the 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023, at Toulouse (France) from October 2nd to 5th, 2023.This international symposiu...

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Bibliographic Details
Published in:Microelectronics Reliability 2023
Main Authors: Labat, Nathalie, Nolhier, Nicolas
Format: Text Resource
Language:English
Subjects:
Engineering Sciences
Micro and nanotechnologies
Microelectronics
Online Access:Get full text
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Summary:This special issue of Microelectronics and Reliability is devoted to the publication of the papers presented during the 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023, at Toulouse (France) from October 2nd to 5th, 2023.This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
ISSN:0026-2714
1872-941X