Rutherford backscattering experiments on percolating Pd films

Rutherford backscattering experiments are performed on ultrathin percolating Pd films during irradiation at 300 K with Xe ions. The spectra are sensitive to the topology of the films, allowing us to follow the appearance of a percolating structure.

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Bibliographic Details
Published in:Solid state communications 1990, Vol.73 (4), p.285-287
Main Authors: Papandreou, N., Nédellec, P., Traverse, A.
Format: Article
Language:English
Subjects:
Analysing. Testing. Standards
Applied sciences
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Cross-disciplinary physics: materials science
rheology
Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures
Electronic transport phenomena in thin films and low-dimensional structures
Exact sciences and technology
Materials science
Measurement of properties and materials state
Metals, semimetals and alloys
Metals. Metallurgy
Nondestructive testing
Physics
Specific materials
Citations: Items that this one cites
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Description
Summary:Rutherford backscattering experiments are performed on ultrathin percolating Pd films during irradiation at 300 K with Xe ions. The spectra are sensitive to the topology of the films, allowing us to follow the appearance of a percolating structure.
ISSN:0038-1098
1879-2766
DOI:10.1016/0038-1098(90)90737-V