Depth locating of elements by the PIXE technique

We propose here a method to estimate whether two kinds of elements of different atomic numbers are at the same depth in a sample. A PIXE experiment provides the number of X-rays emitted from these elements when hit by a proton beam at two close lying energies. The variation of these numbers versus e...

Full description

Saved in:
Bibliographic Details
Published in:Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Beam interactions with materials and atoms, 1997, Vol.132 (3), p.521-527
Main Authors: Lagarde, Gérard, Midy, Pierre, Brissaud, Ivan
Format: Article
Language:English
Subjects:
Instrumentation and Detectors
Physics
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We propose here a method to estimate whether two kinds of elements of different atomic numbers are at the same depth in a sample. A PIXE experiment provides the number of X-rays emitted from these elements when hit by a proton beam at two close lying energies. The variation of these numbers versus energy allows one to deduce the desired information on these depths after correcting the effects of atomic numbers. A few examples of applications are presented in order to demonstrate the sensitivity of this procedure.
ISSN:0168-583X
1872-9584
1872-9584
0168-583X
DOI:10.1016/S0168-583X(97)00477-1