Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

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Bibliographic Details
Published in:IEEE transactions on nuclear science 2015-12, Vol.62 (6), p.2620-2626
Main Authors: Bosser, Alexandre Louis, Gupta, Viyas, Tsiligiannis, Georgios, Javanainen, Arto, Kettunen, Heikki, Puchner, Helmut, Saigné, Frédéric, Virtanen, Ari, Wrobel, Frédéric, Dilillo, Luigi
Format: Article
Language:English
Subjects:
Electronics
Engineering Sciences
Physics
Online Access:Get full text
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Description
Summary:During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2015.2496874