Fabrication of Optical Multilayer Devices from Porous Silicon Coatings with Closed Porosity by Magnetron Sputtering

• Published in: ACS applied materials & interfaces 2015-07, Vol.7 (25), p.13889-13897
• Main Authors: Caballero-Hernández, Jaime, Godinho, Vanda, Lacroix, Bertrand, Jiménez de Haro, Maria C, Jamon, Damien, Fernández, Asunción
• Format: Article
• Language: English
• Subjects: Physics
• ISSN: 1944-8244; 1944-8252
• DOI: 10.1021/acsami.5b02356

The fabrication of single-material photonic-multilayer devices is explored using a new methodology to produce porous silicon layers by magnetron sputtering. Our bottom-up methodology produces highly stable amorphous porous silicon films with a controlled refractive index using magnetron sputtering and incorporating a large amount of deposition gas inside the closed pores. The influence of the substrate bias on the formation of the closed porosity was explored here for the first time when He was used as the deposition gas. We successfully simulated, designed, and characterized Bragg reflectors and an optical microcavity that integrates these porous layers. The sharp interfaces between the dense and porous layers combined with the adequate control of the refractive index and thickness allowed for excellent agreement between the simulation and the experiments. The versatility of the magnetron sputtering technique allowed for the preparation of these structures for a wide range of substrates such as polymers while also taking advantage of the oblique angle deposition to prepare Bragg reflectors with a controlled lateral gradient in the stop band wavelengths.