The Effects of Electron Cyclotron Absorption in Powerful Narrow-Band Sub-THz Oscillators Exploiting Volume and Surface Modes

We present the theory, design, and numerical modeling of novel, pulsed sub-THz oscillators based on cylindrical, 2-D periodic surface lattice (PSL) interaction cavities. Investigation of the electronic efficiency and power dependence on the magnitude of the magnetic guide field and the electron beam...

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Bibliographic Details
Published in:IEEE transactions on electron devices 2023-06, Vol.70 (6), p.2760-2766
Main Authors: MacLachlan, A. J., Robertson, C. W., Cross, Adrian W., Phelps, A. D. R.
Format: Article
Language:English
Subjects:
Absorption
Backward waves
Cherenkov
Corrugated surfaces
Couplings
cyclotron absorption
Cyclotrons
electron beam
Electron beams
Electrons
Group velocity
Holes
Lattice vibration
mm-wave
Modal choice
mode coupling
Numerical models
Oscillators
periodic structure
radiation source
Surface chemistry
Surface waves
terahertz
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Summary:We present the theory, design, and numerical modeling of novel, pulsed sub-THz oscillators based on cylindrical, 2-D periodic surface lattice (PSL) interaction cavities. Investigation of the electronic efficiency and power dependence on the magnitude of the magnetic guide field and the electron beam current is investigated. While cyclotron absorption effects have been studied in low-order, 1-D backward wave oscillators (BWOs), few studies have considered cyclotron absorption in highly overmoded, 2D-PSL oscillators. Here we investigate certain behavior associated with cyclotron absorption in 2D-PSL devices with over 400 modes. This electron cyclotron absorption is shown to be a universal process, independent of frequency and transverse cavity size. Dispersive behavior shows minimal group velocity at the point of interaction and demonstrates similarities with degenerate band edge (DBE) phenomena. In this work, the fundamental mode selection mechanism relies on the coupling of high-order volume and surface waves. Good agreement between theory and modeling is presented.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2023.3244160