Non-linear correction method for Si photodiode detectors and its application to the electro-optical measurement for the PDLC film

A corrected measurement method was investigated for the silicon photodiode detector. The measured transmittance error between the silicon photodiode detector and the light power meter occurs and depends on the incident light power. In our work, the non-linear empirical formula was derived from the m...

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Published in:IEEE transactions on instrumentation and measurement 2023-03, p.1-1
Main Authors: Meng, Xiangshen, Li, Jian, Lin, Yueqiang, Liu, Xiaodong, Li, Decai, He, Zhenghong
Format: Article
Language:English
Subjects:
detector
Detectors
electro-optical response
Laser beams
Measurement by laser beam
photodiode
Photodiodes
polymer dispersed liquid crystal
Power measurement
Semiconductor device measurement
Voltage measurement
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Li, Jian
Lin, Yueqiang
Liu, Xiaodong
Li, Decai
He, Zhenghong
description A corrected measurement method was investigated for the silicon photodiode detector. The measured transmittance error between the silicon photodiode detector and the light power meter occurs and depends on the incident light power. In our work, the non-linear empirical formula was derived from the measured results of the silicon photodiode detector and light power meter. In addition, the formula was used to correct the measuring results of the polymer-dispersed liquid crystal, and the corrected results are identical to those of the light power meter. The experimental results further show that the silicon photodiode detector is faster than the light power meter when measuring electro-optical response. As a result, the corrected method is reliable for detecting a fast response by the silicon photodiode detector.
doi_str_mv 10.1109/TIM.2023.3237813
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subjects detector
Detectors
electro-optical response
Laser beams
Measurement by laser beam
photodiode
Photodiodes
polymer dispersed liquid crystal
Power measurement
Semiconductor device measurement
Voltage measurement
title Non-linear correction method for Si photodiode detectors and its application to the electro-optical measurement for the PDLC film
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