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Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique [power modules]
The solder joint between the ceramic substrate and the copper base plate is of critical importance to the reliability of the power module. An improvement of the fatigue life of the solder joint is essential to achieve a reliable module. The development of a new assembly technology for the power modu...
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creator | Hayashi, K. Izuta, G. Murakami, K. Uegai, Y. Takao, H. |
description | The solder joint between the ceramic substrate and the copper base plate is of critical importance to the reliability of the power module. An improvement of the fatigue life of the solder joint is essential to achieve a reliable module. The development of a new assembly technology for the power module improves the fatigue life of solder joints between the ceramic substrate and the copper base plate. The effect of the solder thickness on the fatigue life has been investigated with the elasto-plastic finite element analyses and experiments. The principal factor was the minimum thickness of solder, not the average thickness. The tilt of the substrate caused the solder thickness to become small partially. So the key technology to improve the fatigue life of the solder joint is to prevent the tilt of the substrate, and to control the solder thickness in high-precision level. The technique of setting spacers on the soldering area of the substrate has been examined, and the wire bump technique has been newly developed. In this technique, some small spacers called the wire bump are stitch-bonded near the comers using the aluminum bonding wire. |
doi_str_mv | 10.1109/ECTC.2002.1008300 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>pascalfrancis_6IE</sourceid><recordid>TN_cdi_ieee_primary_1008300</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1008300</ieee_id><sourcerecordid>15453813</sourcerecordid><originalsourceid>FETCH-LOGICAL-i203t-11b5cd243583f94276a91220c37f0335fcb8def3bbc18a259cb0a3893ec23f063</originalsourceid><addsrcrecordid>eNpNkE1rwzAMhs0-YKXrDxi7-LJjOtmK4-Q4QvcBhV260xjFcezVXRJnsbvSf7-MDjYhJMTz8B5EyBWDOWNQ3C7KVTnnAHzOAHIEOCETjlImQvLslMwKmcPYKNORnZEJiKxIhAC8ILMQtjCWgKzI5YTEp7Yf_JdpTRept9Sq6N53hjbOmp87-KY2A91618VAqwONG6c_OhMC1b6Lg2_-WXsXN-MYDK12bU-j0ZvOfY5pr73fj7z19a4x4e2SnFvVBDP73VPycr9YlY_J8vnhqbxbJo4DxoSxSuiapyhytEXKZaYKxjlolBYQhdVVXhuLVaVZrrgodAUK8wKN5mghwym5Oeb2KmjV2EF12oV1P7hWDYc1E6nAnOHoXR89Z4z5w8ff4jcE8Gwz</addsrcrecordid><sourcetype>Index Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique [power modules]</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Hayashi, K. ; Izuta, G. ; Murakami, K. ; Uegai, Y. ; Takao, H.</creator><creatorcontrib>Hayashi, K. ; Izuta, G. ; Murakami, K. ; Uegai, Y. ; Takao, H.</creatorcontrib><description>The solder joint between the ceramic substrate and the copper base plate is of critical importance to the reliability of the power module. An improvement of the fatigue life of the solder joint is essential to achieve a reliable module. The development of a new assembly technology for the power module improves the fatigue life of solder joints between the ceramic substrate and the copper base plate. The effect of the solder thickness on the fatigue life has been investigated with the elasto-plastic finite element analyses and experiments. The principal factor was the minimum thickness of solder, not the average thickness. The tilt of the substrate caused the solder thickness to become small partially. So the key technology to improve the fatigue life of the solder joint is to prevent the tilt of the substrate, and to control the solder thickness in high-precision level. The technique of setting spacers on the soldering area of the substrate has been examined, and the wire bump technique has been newly developed. In this technique, some small spacers called the wire bump are stitch-bonded near the comers using the aluminum bonding wire.</description><identifier>ISSN: 0569-5503</identifier><identifier>ISBN: 9780780374300</identifier><identifier>ISBN: 0780374304</identifier><identifier>EISSN: 2377-5726</identifier><identifier>DOI: 10.1109/ECTC.2002.1008300</identifier><language>eng</language><publisher>Piscataway NJ: IEEE</publisher><subject>Applied sciences ; Assembly ; Ceramics ; Copper ; Design. Technologies. Operation analysis. Testing ; Electronics ; Exact sciences and technology ; Fatigue ; Finite element methods ; Integrated circuits ; Multichip modules ; Other multijunction devices. Power transistors. Thyristors ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Soldering ; Space technology ; Testing, measurement, noise and reliability ; Thickness control ; Wire</subject><ispartof>52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345), 2002, p.1469-1474</ispartof><rights>2004 INIST-CNRS</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1008300$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,4036,4037,27902,54530,54895,54907</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1008300$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15453813$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Hayashi, K.</creatorcontrib><creatorcontrib>Izuta, G.</creatorcontrib><creatorcontrib>Murakami, K.</creatorcontrib><creatorcontrib>Uegai, Y.</creatorcontrib><creatorcontrib>Takao, H.</creatorcontrib><title>Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique [power modules]</title><title>52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)</title><addtitle>ECTC</addtitle><description>The solder joint between the ceramic substrate and the copper base plate is of critical importance to the reliability of the power module. An improvement of the fatigue life of the solder joint is essential to achieve a reliable module. The development of a new assembly technology for the power module improves the fatigue life of solder joints between the ceramic substrate and the copper base plate. The effect of the solder thickness on the fatigue life has been investigated with the elasto-plastic finite element analyses and experiments. The principal factor was the minimum thickness of solder, not the average thickness. The tilt of the substrate caused the solder thickness to become small partially. So the key technology to improve the fatigue life of the solder joint is to prevent the tilt of the substrate, and to control the solder thickness in high-precision level. The technique of setting spacers on the soldering area of the substrate has been examined, and the wire bump technique has been newly developed. In this technique, some small spacers called the wire bump are stitch-bonded near the comers using the aluminum bonding wire.</description><subject>Applied sciences</subject><subject>Assembly</subject><subject>Ceramics</subject><subject>Copper</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Fatigue</subject><subject>Finite element methods</subject><subject>Integrated circuits</subject><subject>Multichip modules</subject><subject>Other multijunction devices. Power transistors. Thyristors</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Soldering</subject><subject>Space technology</subject><subject>Testing, measurement, noise and reliability</subject><subject>Thickness control</subject><subject>Wire</subject><issn>0569-5503</issn><issn>2377-5726</issn><isbn>9780780374300</isbn><isbn>0780374304</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpNkE1rwzAMhs0-YKXrDxi7-LJjOtmK4-Q4QvcBhV260xjFcezVXRJnsbvSf7-MDjYhJMTz8B5EyBWDOWNQ3C7KVTnnAHzOAHIEOCETjlImQvLslMwKmcPYKNORnZEJiKxIhAC8ILMQtjCWgKzI5YTEp7Yf_JdpTRept9Sq6N53hjbOmp87-KY2A91618VAqwONG6c_OhMC1b6Lg2_-WXsXN-MYDK12bU-j0ZvOfY5pr73fj7z19a4x4e2SnFvVBDP73VPycr9YlY_J8vnhqbxbJo4DxoSxSuiapyhytEXKZaYKxjlolBYQhdVVXhuLVaVZrrgodAUK8wKN5mghwym5Oeb2KmjV2EF12oV1P7hWDYc1E6nAnOHoXR89Z4z5w8ff4jcE8Gwz</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Hayashi, K.</creator><creator>Izuta, G.</creator><creator>Murakami, K.</creator><creator>Uegai, Y.</creator><creator>Takao, H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope></search><sort><creationdate>2002</creationdate><title>Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique [power modules]</title><author>Hayashi, K. ; Izuta, G. ; Murakami, K. ; Uegai, Y. ; Takao, H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i203t-11b5cd243583f94276a91220c37f0335fcb8def3bbc18a259cb0a3893ec23f063</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Applied sciences</topic><topic>Assembly</topic><topic>Ceramics</topic><topic>Copper</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Fatigue</topic><topic>Finite element methods</topic><topic>Integrated circuits</topic><topic>Multichip modules</topic><topic>Other multijunction devices. Power transistors. Thyristors</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Soldering</topic><topic>Space technology</topic><topic>Testing, measurement, noise and reliability</topic><topic>Thickness control</topic><topic>Wire</topic><toplevel>online_resources</toplevel><creatorcontrib>Hayashi, K.</creatorcontrib><creatorcontrib>Izuta, G.</creatorcontrib><creatorcontrib>Murakami, K.</creatorcontrib><creatorcontrib>Uegai, Y.</creatorcontrib><creatorcontrib>Takao, H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hayashi, K.</au><au>Izuta, G.</au><au>Murakami, K.</au><au>Uegai, Y.</au><au>Takao, H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique [power modules]</atitle><btitle>52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345)</btitle><stitle>ECTC</stitle><date>2002</date><risdate>2002</risdate><spage>1469</spage><epage>1474</epage><pages>1469-1474</pages><issn>0569-5503</issn><eissn>2377-5726</eissn><isbn>9780780374300</isbn><isbn>0780374304</isbn><abstract>The solder joint between the ceramic substrate and the copper base plate is of critical importance to the reliability of the power module. An improvement of the fatigue life of the solder joint is essential to achieve a reliable module. The development of a new assembly technology for the power module improves the fatigue life of solder joints between the ceramic substrate and the copper base plate. The effect of the solder thickness on the fatigue life has been investigated with the elasto-plastic finite element analyses and experiments. The principal factor was the minimum thickness of solder, not the average thickness. The tilt of the substrate caused the solder thickness to become small partially. So the key technology to improve the fatigue life of the solder joint is to prevent the tilt of the substrate, and to control the solder thickness in high-precision level. The technique of setting spacers on the soldering area of the substrate has been examined, and the wire bump technique has been newly developed. In this technique, some small spacers called the wire bump are stitch-bonded near the comers using the aluminum bonding wire.</abstract><cop>Piscataway NJ</cop><pub>IEEE</pub><doi>10.1109/ECTC.2002.1008300</doi><tpages>6</tpages></addata></record> |
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identifier | ISSN: 0569-5503 |
ispartof | 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345), 2002, p.1469-1474 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Applied sciences Assembly Ceramics Copper Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Fatigue Finite element methods Integrated circuits Multichip modules Other multijunction devices. Power transistors. Thyristors Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Soldering Space technology Testing, measurement, noise and reliability Thickness control Wire |
title | Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique [power modules] |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-30T03%3A25%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Improvement%20of%20fatigue%20life%20of%20solder%20joints%20by%20thickness%20control%20of%20solder%20with%20wire%20bump%20technique%20%5Bpower%20modules%5D&rft.btitle=52nd%20Electronic%20Components%20and%20Technology%20Conference%202002.%20(Cat.%20No.02CH37345)&rft.au=Hayashi,%20K.&rft.date=2002&rft.spage=1469&rft.epage=1474&rft.pages=1469-1474&rft.issn=0569-5503&rft.eissn=2377-5726&rft.isbn=9780780374300&rft.isbn_list=0780374304&rft_id=info:doi/10.1109/ECTC.2002.1008300&rft_dat=%3Cpascalfrancis_6IE%3E15453813%3C/pascalfrancis_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i203t-11b5cd243583f94276a91220c37f0335fcb8def3bbc18a259cb0a3893ec23f063%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1008300&rfr_iscdi=true |