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Filters designed for testability wrapped on the Mixed-Signal Test Bus
This work presents a design for test method for continuous time active filters of any order, using the IEEE 1149.4 as its backbone structure. The method relies on the synthesis of filter transfer functions using partial fraction extraction. Transfer functions are built from 1/sup st/ order blocks co...
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| creator | Calvano, J.V. Alves, V.C. Lubaszewski, M. Mesquita, A.C. |
| description | This work presents a design for test method for continuous time active filters of any order, using the IEEE 1149.4 as its backbone structure. The method relies on the synthesis of filter transfer functions using partial fraction extraction. Transfer functions are built from 1/sup st/ order blocks connected via the available standard infrastructure. Under this approach, structural test can be carried out using simple test vectors, which are disclosed according to a fault simulation process. |
| doi_str_mv | 10.1109/VTS.2002.1011139 |
| format | conference_proceeding |
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The method relies on the synthesis of filter transfer functions using partial fraction extraction. Transfer functions are built from 1/sup st/ order blocks connected via the available standard infrastructure. 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Under this approach, structural test can be carried out using simple test vectors, which are disclosed according to a fault simulation process.</description><subject>Active filters</subject><subject>Application software</subject><subject>Built-in self-test</subject><subject>Circuit faults</subject><subject>Circuit simulation</subject><subject>Circuit testing</subject><subject>Design methodology</subject><subject>Integrated circuit modeling</subject><subject>Maintenance</subject><subject>Transfer functions</subject><isbn>9780769515700</isbn><isbn>0769515703</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj01Lw0AURQdEUGr2gpv5A4nvZTJfSy2tChUXDW7LS_KiI7ENmRHtvzfQ3s2By-HCFeIWoUAEf_9eb4sSoCwQEFH5C5F568Aar1FbgCuRxfgFcyqNTlfXYrUOQ-Ipyo5j-NhzJ_vDJBPHRE0YQjrK34nGce4Pe5k-Wb6GP-7y7ezSIOvZk48_8UZc9jREzs5ciHq9qpfP-ebt6WX5sMkDWp1yUtCQcWVTOQeqRWqx98xE1rW6dX1vtDWtq7oKvXGV9YodQgeOLJuS1ELcnWYDM-_GKXzTdNydv6p_kWtJJg</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Calvano, J.V.</creator><creator>Alves, V.C.</creator><creator>Lubaszewski, M.</creator><creator>Mesquita, A.C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>2002</creationdate><title>Filters designed for testability wrapped on the Mixed-Signal Test Bus</title><author>Calvano, J.V. ; Alves, V.C. ; Lubaszewski, M. ; Mesquita, A.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-a30ba682b48803c1ac1f9eeaa78c5c8ff6576c84d419684793e810d08a7e62a3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Active filters</topic><topic>Application software</topic><topic>Built-in self-test</topic><topic>Circuit faults</topic><topic>Circuit simulation</topic><topic>Circuit testing</topic><topic>Design methodology</topic><topic>Integrated circuit modeling</topic><topic>Maintenance</topic><topic>Transfer functions</topic><toplevel>online_resources</toplevel><creatorcontrib>Calvano, J.V.</creatorcontrib><creatorcontrib>Alves, V.C.</creatorcontrib><creatorcontrib>Lubaszewski, M.</creatorcontrib><creatorcontrib>Mesquita, A.C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library Online</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Calvano, J.V.</au><au>Alves, V.C.</au><au>Lubaszewski, M.</au><au>Mesquita, A.C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Filters designed for testability wrapped on the Mixed-Signal Test Bus</atitle><btitle>Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)</btitle><stitle>VTS</stitle><date>2002</date><risdate>2002</risdate><spage>201</spage><epage>206</epage><pages>201-206</pages><isbn>9780769515700</isbn><isbn>0769515703</isbn><abstract>This work presents a design for test method for continuous time active filters of any order, using the IEEE 1149.4 as its backbone structure. 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| identifier | ISBN: 9780769515700 |
| ispartof | Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 2002, p.201-206 |
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| language | eng |
| recordid | cdi_ieee_primary_1011139 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Active filters Application software Built-in self-test Circuit faults Circuit simulation Circuit testing Design methodology Integrated circuit modeling Maintenance Transfer functions |
| title | Filters designed for testability wrapped on the Mixed-Signal Test Bus |
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