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Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing?
The use of Resistive Random Access Memories (RRAMs) for implementing emerging applications depends not only on being able to properly test them after manufacturing, but also being able to guarantee their reliability during lifetime. These novel non-volatile memories can be affected by manufacturing...
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creator | Bolzani Poehls, L. M. |
description | The use of Resistive Random Access Memories (RRAMs) for implementing emerging applications depends not only on being able to properly test them after manufacturing, but also being able to guarantee their reliability during lifetime. These novel non-volatile memories can be affected by manufacturing deviations, process variation and defects, as well as by time-dependent deviations, environmental and temporal variations. In this context, this tutorial aims to introduce the main sources of reliability issues at time zero and during lifetime, high-lighting the challenges related to properly identify manufacturing failure mechanisms and consequently, the deviation of more ac-curate fault models. In addition, this tutorial aims to summarize the state-of-the-art regarding manufacturing test strategies and provide a discussion about the key challenges of testing RRAMs at time zero. Finally, this tutorial provides information about how to increase the efficiency of manufacturing test strategies in order to avoid test escapes, which can compromise RRAM's reliability during lifetime. |
doi_str_mv | 10.1109/DDECS57882.2023.10139525 |
format | conference_proceeding |
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M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bolzani Poehls, L. 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fulltext | fulltext_linktorsrc |
identifier | EISSN: 2473-2117 |
ispartof | 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2023, p.167-168 |
issn | 2473-2117 |
language | eng |
recordid | cdi_ieee_primary_10139525 |
source | IEEE Xplore All Conference Series |
subjects | Failure analysis Fault diagnosis Manufacturing Manufacturing Test Strategies Nonvolatile memory Random access memory Reliability engineering RRAMs Sources of Reliability Issues Stress Conditions Tutorials |
title | Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing? |
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