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Mitigate IR-Drop Effect by Modulating Neuron Activation Functions for Implementing Neural Networks on Memristor Crossbar Arrays

The line resistance (LR) in a large-scale memristor crossbar array can cause serious IR-drop problem, degrading the hardware deployment capability of neural networks (NNs). In this work, two innovation schemes from the level of software are proposed to mitigate the hardware IR-drop problem by intent...

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Bibliographic Details
Published in:IEEE electron device letters 2023-08, Vol.44 (8), p.1-1
Main Authors: Song, Danzhe, Yang, Fan, Wang, Chengxu, Li, Nan, Jiang, Pinfeng, Gao, Bin, Miao, Xiangshui, Wang, Xingsheng
Format: Article
Language:English
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Summary:The line resistance (LR) in a large-scale memristor crossbar array can cause serious IR-drop problem, degrading the hardware deployment capability of neural networks (NNs). In this work, two innovation schemes from the level of software are proposed to mitigate the hardware IR-drop problem by intentionally modulating the NN activation function before deploying. The methods are evaluated over typical activation functions and various line resistances on MLP and LeNet-5 for MNIST recognition. Results show the methods can significantly improve the tolerance of NNs to IR-drop and recover the accuracy in some extent. The methods require no extra hardware overhead and reduce the complexity of peripheral circuits, which make them more achievable and attractive.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2023.3285916