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Mitigate IR-Drop Effect by Modulating Neuron Activation Functions for Implementing Neural Networks on Memristor Crossbar Arrays
The line resistance (LR) in a large-scale memristor crossbar array can cause serious IR-drop problem, degrading the hardware deployment capability of neural networks (NNs). In this work, two innovation schemes from the level of software are proposed to mitigate the hardware IR-drop problem by intent...
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Published in: | IEEE electron device letters 2023-08, Vol.44 (8), p.1-1 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The line resistance (LR) in a large-scale memristor crossbar array can cause serious IR-drop problem, degrading the hardware deployment capability of neural networks (NNs). In this work, two innovation schemes from the level of software are proposed to mitigate the hardware IR-drop problem by intentionally modulating the NN activation function before deploying. The methods are evaluated over typical activation functions and various line resistances on MLP and LeNet-5 for MNIST recognition. Results show the methods can significantly improve the tolerance of NNs to IR-drop and recover the accuracy in some extent. The methods require no extra hardware overhead and reduce the complexity of peripheral circuits, which make them more achievable and attractive. |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/LED.2023.3285916 |