Application of k-NN based segmentation algorithm in system for automated measurement of surface phenomena

This paper presents the application of a new segmentation algorithm in a computer-based system for high temperature measurements of superficial properties. This newly developed segmentation algorithm is based on statistical pattern recognition theory.

Saved in:
Bibliographic Details
Main Authors: Sankowski, D., Strzecha, K.
Format: Conference Proceeding
Language:English
Subjects:
Application software
Glass industry
Image converters
Image segmentation
Metals industry
Optical recording
Shape
Solids
Surface tension
Temperature measurement
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper presents the application of a new segmentation algorithm in a computer-based system for high temperature measurements of superficial properties. This newly developed segmentation algorithm is based on statistical pattern recognition theory.
DOI:10.1109/TCSET.2002.1015945