Total Ionizing Dose and Proton Single Event Effects in AMD Ryzen Processor Fabricated in a 12-nm Bulk FinFET Process

The Aerospace Corporation performed total ionizing dose (TID) and proton testing on the AMD Ryzen 3200G processor. The Ryzen processor is a system on chip that contains a 4-core central processing unit (CPU) and an integrated graphical processing unit (GPU). No changes in CPU performance were observ...

Full description

Saved in:
Bibliographic Details
Main Authors: Taggart, Jennifer L., Davis, Scott C., Daniel, Richard, Foran, Brendan J., Bohra, Dhruv L., Hall, Andrew J., Wright, Aaron W., Hunnicutt, Hope
Format: Conference Proceeding
Language:English
Subjects:
Central Processing Unit
COTS
Degradation
finFET
Graphics processing units
Memory management
Processors
Protons
Radiation Effects
Random access memory
Voltage
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The Aerospace Corporation performed total ionizing dose (TID) and proton testing on the AMD Ryzen 3200G processor. The Ryzen processor is a system on chip that contains a 4-core central processing unit (CPU) and an integrated graphical processing unit (GPU). No changes in CPU performance were observed until 600 krad(Si) of dose, while changes to GPU performance were first noticed at 500 krad(Si). Degradation in CPU performance was only observed in processes requiring access to off chip memory, suggesting that radiation effects are most prevalent in the I/O circuitry and not in the digital logic or internal registers.
ISSN:2154-0535
DOI:10.1109/REDW61050.2023.10265851