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High-Energy Atmospheric Neutrons Characterization of Microchip LX4580

The high-energy atmospheric neutrons single event effects characterization results of Microchip Technology's 24-channel data acquisition system with synchronized motor control interface IC, the LX4580, are presented. The test was performed at the Los Alamos Neutron Science Center. No latch-up o...

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Main Authors: Leuenberger, Marco, Stevens, Russell, Spanoche, Sorin, Johnson, Dorian
Format: Conference Proceeding
Language:English
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Stevens, Russell
Spanoche, Sorin
Johnson, Dorian
description The high-energy atmospheric neutrons single event effects characterization results of Microchip Technology's 24-channel data acquisition system with synchronized motor control interface IC, the LX4580, are presented. The test was performed at the Los Alamos Neutron Science Center. No latch-up occurred during the entire testing and all blocks exhibited great behavior. The use of simple filtering on the acquisition data results in an overall event rate estimated to be 5.8x10 −10 events per chip per flight-hour at peak flux, well below the target of 10- 7 .
doi_str_mv 10.1109/REDW61050.2023.10265856
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ispartof 2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC), 2023, p.1-5
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source IEEE Xplore All Conference Series
subjects Data acquisition
Filtering
Integrated circuits
Motor drives
Neutrons
Radiation effects
Temperature distribution
title High-Energy Atmospheric Neutrons Characterization of Microchip LX4580
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