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Characterization of Widefield THz Optics Using Phase Shifting Interferometry

Characterization of wide-field optics in the Terahertz regime imposes new and demanding requirements for testing systems. Basic optical parameters can be determined from scalar planar characterization, obtained using monochromatic or thermal sources located in the instrument focal plane. In contrast...

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Published in:IEEE transactions on terahertz science and technology 2023-11, Vol.13 (6), p.614-621
Main Authors: Reyes, Nicolas, Mayorga, Ivan Camara, Grutzeck, Gerrit, Yates, Stephen J.C., Baryshev, Andrey, Baselmans, Jochem, Weiss, Axel, Klein, Bernd
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cited_by cdi_FETCH-LOGICAL-c337t-507b4c872b0153129b0f5304e24e6fef8d63855df1bf5149434a68e101a61af43
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container_title IEEE transactions on terahertz science and technology
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creator Reyes, Nicolas
Mayorga, Ivan Camara
Grutzeck, Gerrit
Yates, Stephen J.C.
Baryshev, Andrey
Baselmans, Jochem
Weiss, Axel
Klein, Bernd
description Characterization of wide-field optics in the Terahertz regime imposes new and demanding requirements for testing systems. Basic optical parameters can be determined from scalar planar characterization, obtained using monochromatic or thermal sources located in the instrument focal plane. In contrast, important features, such as the spillover efficiency, wave front error, or aperture efficiency cannot be easily measured by such approaches. Moreover, when instruments have a curved focal plane, designed to match the hosting telescope, even basic parameters are difficult to extract from scalar planar measurements. In such cases, the use of phase and amplitude information is mandatory. From a complex planar measurement, the complete information of the optical system can be obtained, allowing the estimation of all relevant optical parameters. In this work, we present and demonstrate experimentally a technique to perform such measurement based on the use of continuous wave photonic terahertz sources. Here, we present our results at 350 GHz and 850 GHz, demonstrating the feasibility of performing measurements at different submillimeter frequencies using a single experimental setup. The proposed system was implemented to fully characterize a wide-field submillimeter camera based on kinetic inductance detectors designed to be deployed at the APEX Telescope in Chile.
doi_str_mv 10.1109/TTHZ.2023.3320554
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subjects Astronomical instruments
Continuous radiation
Detectors
Experimental methods
Focal plane
Inductance
Instruments
kinetic inductance detectors
Optical detectors
Optical diffraction
Optical mixing
Optical polarization
Optical reflection
Optics
Parameters
Terahertz frequencies
terahertz optics
Wave fronts
title Characterization of Widefield THz Optics Using Phase Shifting Interferometry
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