Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs

The dynamics of the SPAD avalanche is a stochastic process that impacts the overall pixel performance, for high count rate and low-power applications. In this paper, we present a novel on-pixel measurement technique, the analysis of the stochastic transient responses and a statistical approach for t...

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Main Authors: Rideau, D., Uhring, W., Bianchi, R. A., Helleboid, R., Mugny, G., Grebot, J., Manouvrier, J.R., Neri, R., Brun, F., Lakeh, M. Dolatpoor, Rink, S., Kammerer, J-B., Lallement, C., Lacombe, E., Golanski, D., Rae, B., Bah, T. M., Twaddle, F., Quenette, V., Marchand, G., Buj, C., Fillon, R., Henrion, Y., Nicholson, I., Agnew, M., Basset, M., Perrier, R., Al-Rawhani, M., Mamdy, B., Pellegrin, S., Gouget, G., Maciazek, P., Juge, A., Dartigues, A., Alause, H. Wehbe
Format: Conference Proceeding
Language:English
Subjects:
Behavioral sciences
Characterization of stochastic responses
Laser radar
Measurement techniques
Solid modeling
SPAD avalanche dynamics
Statistical modelling of SPAD transients
Stochastic processes
Three-dimensional displays
Transient analysis
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Summary:The dynamics of the SPAD avalanche is a stochastic process that impacts the overall pixel performance, for high count rate and low-power applications. In this paper, we present a novel on-pixel measurement technique, the analysis of the stochastic transient responses and a statistical approach for the modeling of SPAD transient behavior.
ISSN:2378-6558
DOI:10.1109/ESSDERC59256.2023.10268474