AFE-CIM: A Current-Domain Compute-In-Memory Macro for Analog-to-Feature Extraction

An SRAM-based mixed-signal current-domain Compute-In-Memory (CIM) macro is presented that extracts low-dimensional digital features from high-dimensional analog inputs (Analog Feature Extraction, AFE). A prototype AFECIM chip in 28nm CMOS extracts 16-channel (S-bit) digital features from 128-channel...

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Bibliographic Details
Main Authors: Sharma, Sudarshan, Wang, Wei-Chun, DeLude, Coleman, Lee, Minah, Rahman, Nael Mizanur, Kidambi, Narasimha Vasishta, Romberg, Justin, Mukhopadhyay, Saibal
Format: Conference Proceeding
Language:English
Subjects:
Analog-to-Feature Extraction
Computing-In-Memory (CIM)
Feature extraction
Mixed-signal Design
Prototypes
Radio frequency
Random access memory
Semiconductor device measurement
Solid state circuit design
SRAM
Throughput
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Summary:An SRAM-based mixed-signal current-domain Compute-In-Memory (CIM) macro is presented that extracts low-dimensional digital features from high-dimensional analog inputs (Analog Feature Extraction, AFE). A prototype AFECIM chip in 28nm CMOS extracts 16-channel (S-bit) digital features from 128-channel analog input (8\times dimension reduction). The chip consumes 71.25 mW at a throughput of 600 Mega-Sample-Per-Second (MSPS, a sample is 128-analog input) achieving 43.7 TOPS/W peak energy efficiency and 120 TOPS/mm^{2} peak computation density.
ISSN:2643-1319
DOI:10.1109/ESSCIRC59616.2023.10268706