Microstrip and Grounded CPW Calibration Kit Comparison for On-Wafer Transistor Characterization from 220 GHz to 325 GHz

In this paper, we investigate the effect of two calibration errors, probe placement and capacitance per unit length, on transistor characterization, from 220 GHz to 325 GHz, on both a microstrip and an inverted coplanar waveguide with a via-stitched ground plane (CPW-G) calibration kit. We find that...

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Bibliographic Details
Main Authors: Jones, Rob D., Cheron, Jerome, Bosworth, Bryan T., Jamroz, Benjamin F., Williams, Dylan F., Urteaga, Miguel E., Feldman, Ari D., Aaen, Peter H.
Format: Conference Proceeding
Language:English
Subjects:
Calibration
common base
common emitter
coplanar waveguide
Frequency measurement
HBT
Measurement uncertainty
microstrip
on-wafer
Scattering parameters
Semiconductor device measurement
Transistors
Uncertainty
WR 3.4
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Summary:In this paper, we investigate the effect of two calibration errors, probe placement and capacitance per unit length, on transistor characterization, from 220 GHz to 325 GHz, on both a microstrip and an inverted coplanar waveguide with a via-stitched ground plane (CPW-G) calibration kit. We find that the calibration errors tend to be greater for the microstrip calibration than for the CPW-G calibration. These findings have critical ramifications for transistor characterization and modelling, and active circuit design.
ISSN:2831-4999
DOI:10.1109/BCICTS54660.2023.10310853