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Characterization of MOCVD-grown InNAs/GaAs quantum wells

Summary form only given. In this paper, we report the successful MOCVD growth of InNAs QWs using dimethylhydrazine (DMHy) as the nitrogen source. Crystalline quality, composition, and thicknesses of the grown layers were investigated by high- resolution X-ray diffraction.

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Main Authors: Hongjun Cao, Nuntawong, N., El-Emawy, A.-R.A., Osinski, M.
Format: Conference Proceeding
Language:English
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creator Hongjun Cao
Nuntawong, N.
El-Emawy, A.-R.A.
Osinski, M.
description Summary form only given. In this paper, we report the successful MOCVD growth of InNAs QWs using dimethylhydrazine (DMHy) as the nitrogen source. Crystalline quality, composition, and thicknesses of the grown layers were investigated by high- resolution X-ray diffraction.
doi_str_mv 10.1109/CLEO.2002.1034440
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identifier ISBN: 1557527067
ispartof Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. Technical Diges, 2002, p.653-654 vol.1
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Absorption
Aluminum gallium nitride
Electrons
Gallium arsenide
Gallium nitride
Lattices
MOCVD
Nitrogen
Plasma materials processing
Quantum well devices
title Characterization of MOCVD-grown InNAs/GaAs quantum wells
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