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Characterization of MOCVD-grown InNAs/GaAs quantum wells
Summary form only given. In this paper, we report the successful MOCVD growth of InNAs QWs using dimethylhydrazine (DMHy) as the nitrogen source. Crystalline quality, composition, and thicknesses of the grown layers were investigated by high- resolution X-ray diffraction.
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container_end_page | 654 vol.1 |
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container_start_page | 653 |
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creator | Hongjun Cao Nuntawong, N. El-Emawy, A.-R.A. Osinski, M. |
description | Summary form only given. In this paper, we report the successful MOCVD growth of InNAs QWs using dimethylhydrazine (DMHy) as the nitrogen source. Crystalline quality, composition, and thicknesses of the grown layers were investigated by high- resolution X-ray diffraction. |
doi_str_mv | 10.1109/CLEO.2002.1034440 |
format | conference_proceeding |
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In this paper, we report the successful MOCVD growth of InNAs QWs using dimethylhydrazine (DMHy) as the nitrogen source. Crystalline quality, composition, and thicknesses of the grown layers were investigated by high- resolution X-ray diffraction.</description><identifier>ISBN: 1557527067</identifier><identifier>ISBN: 9781557527066</identifier><identifier>DOI: 10.1109/CLEO.2002.1034440</identifier><language>eng</language><publisher>IEEE</publisher><subject>Absorption ; Aluminum gallium nitride ; Electrons ; Gallium arsenide ; Gallium nitride ; Lattices ; MOCVD ; Nitrogen ; Plasma materials processing ; Quantum well devices</subject><ispartof>Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. 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Crystalline quality, composition, and thicknesses of the grown layers were investigated by high- resolution X-ray diffraction.</description><subject>Absorption</subject><subject>Aluminum gallium nitride</subject><subject>Electrons</subject><subject>Gallium arsenide</subject><subject>Gallium nitride</subject><subject>Lattices</subject><subject>MOCVD</subject><subject>Nitrogen</subject><subject>Plasma materials processing</subject><subject>Quantum well devices</subject><isbn>1557527067</isbn><isbn>9781557527066</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj0FOwzAQRS0hpELpARAbXyDp2LHjeBmZ0lYKZFN1W03SMQSlCcSpKjg9kejfvN3Xe4w9CoiFALt0xaqMJYCMBSRKKbhh90Jro6WB1MzYIoRPmKZUklp1xzL3gQPWIw3NL45N3_He89fS7Z-j96G_dHzbveVhucY88O8zduP5xC_UtuGB3XpsAy2unLPdy2rnNlFRrrcuL6LGwhiZyYE0VZNChkbrid5CnWqJCRiZCUJh0dSZ8khVDfroydTSHKnSGaUqmbOn_9uGiA5fQ3PC4edwbUv-AFvOQ4I</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Hongjun Cao</creator><creator>Nuntawong, N.</creator><creator>El-Emawy, A.-R.A.</creator><creator>Osinski, M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2002</creationdate><title>Characterization of MOCVD-grown InNAs/GaAs quantum wells</title><author>Hongjun Cao ; Nuntawong, N. ; El-Emawy, A.-R.A. ; Osinski, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-7344e5eb1558a755155f90c652a307281ea19a7c84faebc05dfe7c27deb58e643</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Absorption</topic><topic>Aluminum gallium nitride</topic><topic>Electrons</topic><topic>Gallium arsenide</topic><topic>Gallium nitride</topic><topic>Lattices</topic><topic>MOCVD</topic><topic>Nitrogen</topic><topic>Plasma materials processing</topic><topic>Quantum well devices</topic><toplevel>online_resources</toplevel><creatorcontrib>Hongjun Cao</creatorcontrib><creatorcontrib>Nuntawong, N.</creatorcontrib><creatorcontrib>El-Emawy, A.-R.A.</creatorcontrib><creatorcontrib>Osinski, M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Hongjun Cao</au><au>Nuntawong, N.</au><au>El-Emawy, A.-R.A.</au><au>Osinski, M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Characterization of MOCVD-grown InNAs/GaAs quantum wells</atitle><btitle>Summaries of Papers Presented at the Lasers and Electro-Optics. 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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Absorption Aluminum gallium nitride Electrons Gallium arsenide Gallium nitride Lattices MOCVD Nitrogen Plasma materials processing Quantum well devices |
title | Characterization of MOCVD-grown InNAs/GaAs quantum wells |
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