The manic depression of microprocessor debug

This paper describes the sometimes exhilarating, sometimes depressing, and always challenging job of leading-edge microprocessor debug. It covers an overview of processor debug, the flows, tools and methods used to perform debug, the process of "root causing" and fixing bugs, and includes...

Full description

Saved in:
Bibliographic Details
Main Author: Josephson, D.D.
Format: Conference Proceeding
Language:English
Subjects:
Applied sciences
Circuit testing
Computer bugs
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Frequency
Integrated circuits
Integrated circuits by function (including memories and processors)
Job design
Low voltage
Manuals
Microprocessors
Needles
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Silicon
System testing
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This paper describes the sometimes exhilarating, sometimes depressing, and always challenging job of leading-edge microprocessor debug. It covers an overview of processor debug, the flows, tools and methods used to perform debug, the process of "root causing" and fixing bugs, and includes case studies of actual bugs from recent processors. In conclusion, some of the future challenges for microprocessor testing are presented.
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2002.1041817