Variance and Skewness of Current Fluctuations Experimentally Evidenced in Single-Photon Avalanche Diodes

Consistently with recently published theoretical work, we experimentally demonstrate that, in electronic devices exhibiting strongly nonlinear current-voltage characteristics, the white noise cannot be purely Gaussian, as predicted by the stochastic thermodynamic relations. Micro-fabricated silicon...

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Bibliographic Details
Main Authors: Van Brandt, Leopold, Vercauteren, Roselien, Enriquez, Diego Haya, Andre, Nicolas, Kilchytska, Valeriya, Flandre, Denis, Delvenne, Jean-Charles
Format: Conference Proceeding
Language:English
Subjects:
Fluctuations
Noise measurement
Silicon
Stochastic processes
Thermodynamics
Time measurement
White noise
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Summary:Consistently with recently published theoretical work, we experimentally demonstrate that, in electronic devices exhibiting strongly nonlinear current-voltage characteristics, the white noise cannot be purely Gaussian, as predicted by the stochastic thermodynamic relations. Micro-fabricated silicon single-photon avalanche diodes exemplify this result. Relying on high-accuracy time-domain noise measurements, we go beyond the conventional characterization of fluctuations in terms of mean and variance only by also assessing the third moment (skewness).
ISSN:2575-5595
DOI:10.1109/ICNF57520.2023.10472747